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Subject: Re: PCI and IBIS
To: Syed Huq <shuq@cisco.com>
Cc: ibis@vhdl.org
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From: "Gregory R Edlund" <gedlund@us.ibm.com>
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Syed,

I asked this question two years ago.  Here are the answers I got.

Greg Edlund
Advisory Engineer
Electrical Packaging
IBM Server Technology Development
3605 Hwy. 52 N, Dept. HDC
Rochester, MN 55901
gedlund@us.ibm.com



To All:

The IBIS Version 3.1 format could theoretically handle this
multiple test load situation by using the [Model Selector]
keyword to reference individual [Model] keywords containing
the same information except for the individually specified
test loads.  However, it is likely that the user would to
manually manage the analysis for testing the design corners.

Bob Ross
Interconnectix/Mentor Graphics



Hi Greg,

I ran into this exact problem when I was trying to set up a simulation
environment for the 66 MHz PCI bus.  Fortunately, the IBIS simulator I am
using
allows me to choose whether I want the buffer delays to come from a
simulation
into the standard load circuit from the IBIS model or from time values
which I
directly give to the simulator.  So what I did was use Spice to measure the
rise
and fall delays into their respective standard load circuits; I then gave
those
Spice generated numbers to my IBIS simulator.  Not an ideal solution, but a

workaround that worked good enough.

Unfortunately, this solution doesn't help you much if you can't directly
give
buffer delays to your simulator.  The ideal solution would be to enhance
the
IBIS spec to allow for a unique standard load circuit for both the rising
and
falling edges; that is, if this is a common problem.  Or is this pretty
much an
isolated case with the 66 MHz PCI spec?

Regards,

Tay Ansari
Sun Microsystems




We had a similar problem with a Motorola MPC750.  The L2 cache MAX timing
numbers are specified to a 20pF load and the MIN numbers to a 5pF load.
We were using ICX to analyze timing.  We looked at the output under no
load,
then at 20pF and 5pF.  The delta was measured to be 477ps.  We then
adjusted
the timing sheets in ICX so that the minimum allowed routing distance was
effectively increased by 477ps to compensate for the additional 'test'
load.
This allowed us to use a single IBIS model with Cref set at 20pF.  You may
be able to apply a similar 'trick' with the PCI driver and Vref.

David Haedge
Raytheon Systems Company



Greg,

You can put the two Vref numbers into the IBIS model and comment one of
them

out.  Unfortunately this means that you have to simulate things twice (with

most IBIS based simulators), but fortunately the waveforms are not effected
by
this, only the flight time measurements.  So one of the simulations could
do

the falling edge measurements, and the other one the rising edge
measurements.
If you need more detail send me another EMAIL, and I will give you an
example.

Arpad Muranyi
Intel Corporation
============================================================================



A question came up here at IBM today that I could not answer.  Has anyone
run
into this?

The 66 MHz PCI bus spec has a different standard load for rising and
falling

edges.  (10 pF and 25 Ohms to gnd for rising OR 10 pF and 25 Ohms to Vcc
for

falling.)  As I read version 3.1 of IBIS, it only allows one value of Vref
per
[Model] keyword.  This seems to make the 66 MHz PCI driver unable to be
implemented in IBIS, at least if you want to do timing analysis.  I would
think
someone else probably encountered this already.  How did you get around it?
Or
am I missing something?

Much thanks in advance.

Greg Edlund
Advisory Engineer, AS/400 System Timing
IBM
3650 Hwy. 52 N, Dept. HDC
Rochester, MN 55901
gedlund@us.ibm.com



Syed Huq <shuq@cisco.com> on 02/01/2001 11:32:09 PM

Please respond to Syed Huq <shuq@cisco.com>

To:   ibis-users@eda.org
cc:
Subject:  PCI and IBIS



IBISgurus:

The PCI spec mentions of multiple Vmeas data points based on Rising edge
or Falling edge. Since IBIS has only one Vmeas for any Output/I_O etc, how
does the model provider spec the PCI Vmeas values ?


Regards,
Syed
Cisco Systems, Inc




 
From owner-ibis Fri Feb  2 07:57:42 2001
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From: "Muranyi, Arpad" <arpad.muranyi@intel.com>
To: ibis@vhdl.org
Subject: RE: PCI and IBIS
Date: Fri, 2 Feb 2001 07:53:42 -0800 
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The problem with Bob's response from two years ago is that
you can't swith between buffers with the model selector
for rising and another one for falling edge...

Arpad
==========================================================

-----Original Message-----
From: Gregory R Edlund [mailto:gedlund@us.ibm.com]
Sent: Friday, February 02, 2001 6:58 AM
To: Syed Huq
Cc: ibis@vhdl.org
Subject: Re: PCI and IBIS



Syed,

I asked this question two years ago.  Here are the answers I got.

Greg Edlund
Advisory Engineer
Electrical Packaging
IBM Server Technology Development
3605 Hwy. 52 N, Dept. HDC
Rochester, MN 55901
gedlund@us.ibm.com



To All:

The IBIS Version 3.1 format could theoretically handle this
multiple test load situation by using the [Model Selector]
keyword to reference individual [Model] keywords containing
the same information except for the individually specified
test loads.  However, it is likely that the user would to
manually manage the analysis for testing the design corners.

Bob Ross
Interconnectix/Mentor Graphics



Hi Greg,

I ran into this exact problem when I was trying to set up a simulation
environment for the 66 MHz PCI bus.  Fortunately, the IBIS simulator I am
using
allows me to choose whether I want the buffer delays to come from a
simulation
into the standard load circuit from the IBIS model or from time values
which I
directly give to the simulator.  So what I did was use Spice to measure the
rise
and fall delays into their respective standard load circuits; I then gave
those
Spice generated numbers to my IBIS simulator.  Not an ideal solution, but a

workaround that worked good enough.

Unfortunately, this solution doesn't help you much if you can't directly
give
buffer delays to your simulator.  The ideal solution would be to enhance
the
IBIS spec to allow for a unique standard load circuit for both the rising
and
falling edges; that is, if this is a common problem.  Or is this pretty
much an
isolated case with the 66 MHz PCI spec?

Regards,

Tay Ansari
Sun Microsystems




We had a similar problem with a Motorola MPC750.  The L2 cache MAX timing
numbers are specified to a 20pF load and the MIN numbers to a 5pF load.
We were using ICX to analyze timing.  We looked at the output under no
load,
then at 20pF and 5pF.  The delta was measured to be 477ps.  We then
adjusted
the timing sheets in ICX so that the minimum allowed routing distance was
effectively increased by 477ps to compensate for the additional 'test'
load.
This allowed us to use a single IBIS model with Cref set at 20pF.  You may
be able to apply a similar 'trick' with the PCI driver and Vref.

David Haedge
Raytheon Systems Company



Greg,

You can put the two Vref numbers into the IBIS model and comment one of
them

out.  Unfortunately this means that you have to simulate things twice (with

most IBIS based simulators), but fortunately the waveforms are not effected
by
this, only the flight time measurements.  So one of the simulations could
do

the falling edge measurements, and the other one the rising edge
measurements.
If you need more detail send me another EMAIL, and I will give you an
example.

Arpad Muranyi
Intel Corporation
============================================================================



A question came up here at IBM today that I could not answer.  Has anyone
run
into this?

The 66 MHz PCI bus spec has a different standard load for rising and
falling

edges.  (10 pF and 25 Ohms to gnd for rising OR 10 pF and 25 Ohms to Vcc
for

falling.)  As I read version 3.1 of IBIS, it only allows one value of Vref
per
[Model] keyword.  This seems to make the 66 MHz PCI driver unable to be
implemented in IBIS, at least if you want to do timing analysis.  I would
think
someone else probably encountered this already.  How did you get around it?
Or
am I missing something?

Much thanks in advance.

Greg Edlund
Advisory Engineer, AS/400 System Timing
IBM
3650 Hwy. 52 N, Dept. HDC
Rochester, MN 55901
gedlund@us.ibm.com



Syed Huq <shuq@cisco.com> on 02/01/2001 11:32:09 PM

Please respond to Syed Huq <shuq@cisco.com>

To:   ibis-users@eda.org
cc:
Subject:  PCI and IBIS



IBISgurus:

The PCI spec mentions of multiple Vmeas data points based on Rising edge
or Falling edge. Since IBIS has only one Vmeas for any Output/I_O etc, how
does the model provider spec the PCI Vmeas values ?


Regards,
Syed
Cisco Systems, Inc





 
From owner-ibis Fri Feb  2 13:32:30 2001
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From: "Muranyi, Arpad" <arpad.muranyi@intel.com>
To: "'ibis@eda.org'" <ibis@eda.org>
Subject: BIRD 65.2
Date: Fri, 2 Feb 2001 13:28:28 -0800 
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****************************************************************************
**
****************************************************************************
**

BIRD ID#:        65.2
ISSUE TITLE:     C_comp Refinements
REQUESTER:       Arpad Muranyi, Intel
DATE SUBMITTED:  10-25-99, 12-12-2000, 2-2-2001
DATE ACCEPTED BY IBIS OPEN FORUM:     Pending

****************************************************************************
**
****************************************************************************
**

STATEMENT OF THE ISSUE:

Currently, the IBIS specification (v3.2) uses a single constant value for
describing the total die capacitance as seen at the pad.  This value is
given
by the subparameter C_comp under the [Model] keyword.  The specification
does
not mention how this capacitance is distributed between the power and ground
references, or how it should be connected to the circuit.

****************************************************************************
**

STATEMENT OF THE RESOLVED SPECIFICATIONS:

Four new subparameters shall be introduced in the IBIS specification under
the [Model] keyword to provide means for a more detailed description for the
die capacitance.  These new subparameters, C_comp_pullup, C_comp_pulldown,
C_comp_power, and C_comp_gnd are associated with the corresponding voltage
reference keywords, [Pullup Reference], [Pulldown Reference], [Power Clamp
Reference], and [GND Clamp Reference], respectively.  This mechanism allows
the association of a specific capacitance between the I/O node and the four
possible supply nodes without disturbing the submodel syntax.

The syntax of these four new subparameters are identical to the existing
C_comp subparameter.

|===========================================================================
==
|     Keyword:  [Model] 
|    Required:  Yes.
| Description:  Used to define a model, and its attributes.
|  Sub-Params:  Model_type, Polarity, Enable, Vinl, Vinh, C_comp,
|**             C_comp_pullup, C_comp_pulldown, C_comp_power, and
|**             C_comp_gnd Vmeas, Cref, Rref, Vref
| Usage Rules:  Each model type must begin with the keyword [Model].  The
|               model name must match the one that is listed under a [Pin],
|               [Model Selector] or [Series Pin Mapping] keyword and must
not
|               contain more than 20 characters.  A .ibs file must contain
|               enough [Model] keywords to cover all of the model names
|               specified under the [Pin], [Model Selector] and [Series Pin
|               Mapping] keywords, except for those model names that use
|               reserved words (POWER, GND and NC).
|
|               Model_type must be one of the following:
|
|               Input, Output, I/O, 3-state, Open_drain, I/O_open_drain,
|               Open_sink, I/O_open_sink, Open_source, I/O_open_source,
|               Input_ECL, Output_ECL, I/O_ECL, 3-state_ECL, Terminator,
|               Series, and Series_switch.
|
|               Special usage rules apply to the following.  Some
definitions
|               are included for clarification:
|
|               Input              These model types must have Vinl and Vinh
|               I/O                defined.  If they are not defined, the
|               I/O_open_drain     parser issues a warning and the default
|               I/O_open_sink      values of Vinl = 0.8 V and Vinh = 2.0 V
are
|               I/O_open_source    assumed.
|
|               Input_ECL          These model types must have Vinl and Vinh
|               I/O_ECL            defined.  If they are not defined, the
|                                  parser issues a warning and the default
|                                  values of Vinl = -1.475 V and Vinh =
|                                  -1.165 V are assumed.
|
|               Terminator         This model type is an input-only model
|                                  that can have analog loading effects on
the
|                                  circuit being simulated but has no
digital
|                                  logic thresholds.  Examples of
Terminators
|                                  are: capacitors, termination diodes, and
|                                  pullup resistors.
|
|               Output             This model type indicates that an output
|                                  always sources and/or sinks current and
|                                  cannot be disabled.
|
|               3-state            This model type indicates that an output
|                                  can be disabled, i.e. put into a high
|                                  impedance state.
|
|               Open_sink          These model types indicate that the
output
|               Open_drain         has an OPEN side (do not use the [Pullup]
|                                  keyword, or if it must be used, set I =
|                                  0 mA for all voltages specified) and the
|                                  output SINKS current.  Open_drain model
|                                  type is retained for backward
|                                  compatibility.
|
|               Open_source        This model type indicates that the output
|                                  has an OPEN side (do not use the
[Pulldown]
|                                  keyword, or if it must be used, set I =
|                                  0 mA for all voltages specified) and the
|                                  output SOURCES current.
|
|               Input_ECL          These model types specify that the model
|               Output_ECL         represents an ECL type logic that follows
|               I/O_ECL            different conventions for the [Pulldown]
|               3-state_ECL        keyword.
|
|               Series             This model type is for series models that
|                                  can be described by [R Series], [L
Series],
|                                  [Rl Series], [C Series], [Lc Series],
|                                  [Rc Series], [Series Current] and [Series
|                                  MOSFET] keywords
|                                 
|               Series_switch      This model type is for series switch
|                                  models that can be described by [On],
|                                  [Off], [R Series], [L Series], [Rl
Series],  
|                                  [C Series], [Lc Series], [Rc Series],
|                                  [Series Current] and [Series MOSFET]
|                                  keywords
|
|**             The Model_type subparameter is required.  The C_comp
|**             subparameter is only required if C_comp_pullup,
|**             C_comp_pulldown, C_comp_power, and C_comp_gnd are not
|***            present.  If the C_comp subparameter is not present at least
|***            one of the C_comp_pullup, C_comp_pulldown, C_comp_power, and
|***            C_comp_gnd subparameters is required.  It is not illegal 
|***            to define all five of these subparameters, but in that case
|***            the simulator tool will have to make a decision whether 
|***            to use the old C_comp subparameter or the new C_comp_*
|***            subparameters.  Under no circumstances should all five
|***            subparameters be used simultaneously.
|
|               The Polarity, Enable, Vinl, Vinh, Vmeas, Cref, Rref, and
Vref
|*              subparameters are optional.  C_comp* define the silicon die
|*              capacitance.  Thse values should not include the capacitance
|*              of the package.  C_comp* are allowed to use "NA" for the min
|               and max values only.  The Polarity subparameter can be
|               defined as either Non-Inverting or Inverting, and the Enable
|               subparameter can be defined as either Active-High or
|               Active-Low.
|
|               The Cref and Rref subparameters correspond to the test load
|               that the semiconductor vendor uses when specifying the
|               propagation delay and/or output switching time of the model.
|               The Vmeas subparameter is the reference voltage level that
the
|               semiconductor vendor uses for the model.  Include Cref,
Rref,
|               Vref, and Vmeas information to facilitate board-level timing
|               simulation.  The assumed connections for Cref, Rref, and
Vref
|               are shown in the following diagram:
|
|                            _________
|                           |         |
|                           |      |\ |            Rref
|                           |Driver| \|------o----/\/\/\----o Vref
|                           |      | /|      |
|                           |      |/ |     === Cref
|                           |_________|      |
|                                            |
|                                           GND
|
| Other Notes:  A complete [Model] description normally contains the
following
|               keywords:  [Voltage Range], [Pullup], [Pulldown], [GND
Clamp],
|               [POWER Clamp], and [Ramp].  A Terminator model uses one or
|               more of the [Rgnd], [Rpower], [Rac], and [Cac].  However,
some
|               models may have only a subset of these keywords.  For
example,
|               an input structure normally only needs the [Voltage Range],
|               [GND Clamp], and possibly the [POWER Clamp] keywords.  If
one
|               or more of [Rgnd], [Rpower], [Rac], and [Cac] keywords are
|               used, then the Model_type must be Terminator.
|---------------------------------------------------------------------------
--
| Signals       CLK1, CLK2,...         | Optional signal list, if desired
[Model]         Clockbuffer
Model_type      I/O
Polarity        Non-Inverting
Enable          Active-High
Vinl = 0.8V                            | input logic "low" DC voltage, if
any
Vinh = 2.0V                            | input logic "high" DC voltage, if
any
Vmeas = 1.5V              | Reference voltage for timing measurements
Cref = 50pF               | Timing specification test load capacitance value
Rref = 500                | Timing specification test load resistance value
Vref = 0                  | Timing specification test load voltage
| variable      typ             min             max
C_comp          12.0pF          10.0pF          15.0pF
|
|===========================================================================
==
|
[Model]         Clockbuffer
Model_type      I/O
Vinl = 0.8V                            | input logic "low" DC voltage, if
any
Vinh = 2.0V                            | input logic "high" DC voltage, if
any
|
| variable      typ             min             max
C_comp_pullup   3.0pF           2.5pF           3.5pF
C_comp_pulldown 2.0pF           1.5pF           2.5pF
C_comp_power    1.0pF           0.5pF           1.5pF
C_comp_gnd      1.0pF           0.5pF           1.5pF
|
****************************************************************************
**

ANALYSIS PATH/DATA THAT LED TO SPECIFICATION:

Problem statement

The single (constant) C_comp value of the current IBIS specification (v3.2)
does not provide enough information for the simulator to accurately simulate
high speed signals and/or ground and supply noise.

In order to simulate the signal current return path and/or supply rail noise
(GND bounce and/or Vcc droop) accurately, a model needs to provide more
detail on the distribution of the total die capacitance between the I/O pad,
power and ground references.  This BIRD attempts to provide the means for
incorporating such information in a model.

The existing C_comp subparameter does not specify how it should be connected
between the I/O pad and the supply rails.  Most naturally it will end up
getting connected to the I/O node and ground.  However, since it not only
represents the capacitance of the pulldown device, but also the capacitance
of
the pullup device, one should split it between the I/O pin and ground, and
the
I/O pin and power rails.  One can easily see that this configuration forms a
series combination of two capacitances between power and ground.
Simulations
show a significant difference in the waveforms for the distributed or lumped
capacitance when power and ground nodes of the die are connected through the
package parasitics to the ideal power source(s).

Possible solutions

1)  Specify splitting factor coefficients
2)  Use a new subparameter under each voltage reference keyword
3)  Use a new subparameter under each I-V curve
4)  Use four new subparameters under the [Model] keyword (as presented in
    this BIRD).

****************************************************************************
**

ANY OTHER BACKGROUND INFORMATION:

Changed the names for the four C_comp* parameters as requested in the 
12-08-2000 IBIS Open Forum Teleconference meeting.  Added the next 
paragraph.

Transistors (consequently buffers) show different parasitic capacitance when
turned on or off.  Additional mechanisms need to be added to the IBIS 
specification to account for these variations.

The voltage dependency of the die capacitance should also be addressed at
some
point. (Use typ., min., max, capacitance vs. voltage tables instead of
single
values)?

****************************************************************************
**


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************************************************************************=
******
************************************************************************=
******

BIRD ID#:        65.2
ISSUE TITLE:     C_comp Refinements
REQUESTER:       Arpad Muranyi, Intel
DATE SUBMITTED:  10-25-99, 12-12-2000, 2-2-2001
DATE ACCEPTED BY IBIS OPEN FORUM:     Pending

************************************************************************=
******
************************************************************************=
******

STATEMENT OF THE ISSUE:

Currently, the IBIS specification (v3.2) uses a single constant value =
for
describing the total die capacitance as seen at the pad.  This value is =
given
by the subparameter C_comp under the [Model] keyword.  The =
specification does
not mention how this capacitance is distributed between the power and =
ground
references, or how it should be connected to the circuit.

************************************************************************=
******

STATEMENT OF THE RESOLVED SPECIFICATIONS:

Four new subparameters shall be introduced in the IBIS specification =
under
the [Model] keyword to provide means for a more detailed description =
for the
die capacitance.  These new subparameters, C_comp_pullup, =
C_comp_pulldown,
C_comp_power, and C_comp_gnd are associated with the corresponding =
voltage
reference keywords, [Pullup Reference], [Pulldown Reference], [Power =
Clamp
Reference], and [GND Clamp Reference], respectively.  This mechanism =
allows
the association of a specific capacitance between the I/O node and the =
four
possible supply nodes without disturbing the submodel syntax.

The syntax of these four new subparameters are identical to the =
existing
C_comp subparameter.

|=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=
=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=
=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=
=3D=3D=3D=3D=3D
|     Keyword:  [Model]=20
|    Required:  Yes.
| Description:  Used to define a model, and its attributes.
|  Sub-Params:  Model_type, Polarity, Enable, Vinl, Vinh, C_comp,
|**             C_comp_pullup, C_comp_pulldown, C_comp_power, and
|**             C_comp_gnd Vmeas, Cref, Rref, Vref
| Usage Rules:  Each model type must begin with the keyword [Model].  =
The
|               model name must match the one that is listed under a =
[Pin],
|               [Model Selector] or [Series Pin Mapping] keyword and =
must not
|               contain more than 20 characters.  A .ibs file must =
contain
|               enough [Model] keywords to cover all of the model names
|               specified under the [Pin], [Model Selector] and [Series =
Pin
|               Mapping] keywords, except for those model names that =
use
|               reserved words (POWER, GND and NC).
|
|               Model_type must be one of the following:
|
|               Input, Output, I/O, 3-state, Open_drain, =
I/O_open_drain,
|               Open_sink, I/O_open_sink, Open_source, I/O_open_source,
|               Input_ECL, Output_ECL, I/O_ECL, 3-state_ECL, =
Terminator,
|               Series, and Series_switch.
|
|               Special usage rules apply to the following.  Some =
definitions
|               are included for clarification:
|
|               Input              These model types must have Vinl and =
Vinh
|               I/O                defined.  If they are not defined, =
the
|               I/O_open_drain     parser issues a warning and the =
default
|               I/O_open_sink      values of Vinl =3D 0.8 V and Vinh =
=3D 2.0 V are
|               I/O_open_source    assumed.
|
|               Input_ECL          These model types must have Vinl and =
Vinh
|               I/O_ECL            defined.  If they are not defined, =
the
|                                  parser issues a warning and the =
default
|                                  values of Vinl =3D -1.475 V and Vinh =
=3D
|                                  -1.165 V are assumed.
|
|               Terminator         This model type is an input-only =
model
|                                  that can have analog loading effects =
on the
|                                  circuit being simulated but has no =
digital
|                                  logic thresholds.  Examples of =
Terminators
|                                  are: capacitors, termination diodes, =
and
|                                  pullup resistors.
|
|               Output             This model type indicates that an =
output
|                                  always sources and/or sinks current =
and
|                                  cannot be disabled.
|
|               3-state            This model type indicates that an =
output
|                                  can be disabled, i.e. put into a =
high
|                                  impedance state.
|
|               Open_sink          These model types indicate that the =
output
|               Open_drain         has an OPEN side (do not use the =
[Pullup]
|                                  keyword, or if it must be used, set =
I =3D
|                                  0 mA for all voltages specified) and =
the
|                                  output SINKS current.  Open_drain =
model
|                                  type is retained for backward
|                                  compatibility.
|
|               Open_source        This model type indicates that the =
output
|                                  has an OPEN side (do not use the =
[Pulldown]
|                                  keyword, or if it must be used, set =
I =3D
|                                  0 mA for all voltages specified) and =
the
|                                  output SOURCES current.
|
|               Input_ECL          These model types specify that the =
model
|               Output_ECL         represents an ECL type logic that =
follows
|               I/O_ECL            different conventions for the =
[Pulldown]
|               3-state_ECL        keyword.
|
|               Series             This model type is for series models =
that
|                                  can be described by [R Series], [L =
Series],
|                                  [Rl Series], [C Series], [Lc =
Series],
|                                  [Rc Series], [Series Current] and =
[Series
|                                  MOSFET] keywords
|                                =20
|               Series_switch      This model type is for series switch
|                                  models that can be described by =
[On],
|                                  [Off], [R Series], [L Series], [Rl =
Series], =20
|                                  [C Series], [Lc Series], [Rc =
Series],
|                                  [Series Current] and [Series MOSFET]
|                                  keywords
|
|**             The Model_type subparameter is required.  The C_comp
|**             subparameter is only required if C_comp_pullup,
|**             C_comp_pulldown, C_comp_power, and C_comp_gnd are not
|***            present.  If the C_comp subparameter is not present at =
least
|***            one of the C_comp_pullup, C_comp_pulldown, =
C_comp_power, and
|***            C_comp_gnd subparameters is required.  It is not =
illegal=20
|***            to define all five of these subparameters, but in that =
case
|***            the simulator tool will have to make a decision whether =

|***            to use the old C_comp subparameter or the new C_comp_*
|***            subparameters.  Under no circumstances should all five
|***            subparameters be used simultaneously.
|
|               The Polarity, Enable, Vinl, Vinh, Vmeas, Cref, Rref, =
and Vref
|*              subparameters are optional.  C_comp* define the silicon =
die
|*              capacitance.  Thse values should not include the =
capacitance
|*              of the package.  C_comp* are allowed to use "NA" for =
the min
|               and max values only.  The Polarity subparameter can be
|               defined as either Non-Inverting or Inverting, and the =
Enable
|               subparameter can be defined as either Active-High or
|               Active-Low.
|
|               The Cref and Rref subparameters correspond to the test =
load
|               that the semiconductor vendor uses when specifying the
|               propagation delay and/or output switching time of the =
model.
|               The Vmeas subparameter is the reference voltage level =
that the
|               semiconductor vendor uses for the model.  Include Cref, =
Rref,
|               Vref, and Vmeas information to facilitate board-level =
timing
|               simulation.  The assumed connections for Cref, Rref, =
and Vref
|               are shown in the following diagram:
|
|                            _________
|                           |         |
|                           |      |\ |            Rref
|                           |Driver| \|------o----/\/\/\----o Vref
|                           |      | /|      |
|                           |      |/ |     =3D=3D=3D Cref
|                           |_________|      |
|                                            |
|                                           GND
|
| Other Notes:  A complete [Model] description normally contains the =
following
|               keywords:  [Voltage Range], [Pullup], [Pulldown], [GND =
Clamp],
|               [POWER Clamp], and [Ramp].  A Terminator model uses one =
or
|               more of the [Rgnd], [Rpower], [Rac], and [Cac].  =
However, some
|               models may have only a subset of these keywords.  For =
example,
|               an input structure normally only needs the [Voltage =
Range],
|               [GND Clamp], and possibly the [POWER Clamp] keywords.  =
If one
|               or more of [Rgnd], [Rpower], [Rac], and [Cac] keywords =
are
|               used, then the Model_type must be Terminator.
|-----------------------------------------------------------------------=
------
| Signals       CLK1, CLK2,...         | Optional signal list, if =
desired
[Model]         Clockbuffer
Model_type      I/O
Polarity        Non-Inverting
Enable          Active-High
Vinl =3D 0.8V                            | input logic "low" DC =
voltage, if any
Vinh =3D 2.0V                            | input logic "high" DC =
voltage, if any
Vmeas =3D 1.5V              | Reference voltage for timing measurements
Cref =3D 50pF               | Timing specification test load =
capacitance value
Rref =3D 500                | Timing specification test load resistance =
value
Vref =3D 0                  | Timing specification test load voltage
| variable      typ             min             max
C_comp          12.0pF          10.0pF          15.0pF
|
|=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=
=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=
=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=3D=
=3D=3D=3D=3D=3D
|
[Model]         Clockbuffer
Model_type      I/O
Vinl =3D 0.8V                            | input logic "low" DC =
voltage, if any
Vinh =3D 2.0V                            | input logic "high" DC =
voltage, if any
|
| variable      typ             min             max
C_comp_pullup   3.0pF           2.5pF           3.5pF
C_comp_pulldown 2.0pF           1.5pF           2.5pF
C_comp_power    1.0pF           0.5pF           1.5pF
C_comp_gnd      1.0pF           0.5pF           1.5pF
|
************************************************************************=
******

ANALYSIS PATH/DATA THAT LED TO SPECIFICATION:

Problem statement

The single (constant) C_comp value of the current IBIS specification =
(v3.2)
does not provide enough information for the simulator to accurately =
simulate
high speed signals and/or ground and supply noise.

In order to simulate the signal current return path and/or supply rail =
noise
(GND bounce and/or Vcc droop) accurately, a model needs to provide more
detail on the distribution of the total die capacitance between the I/O =
pad,
power and ground references.  This BIRD attempts to provide the means =
for
incorporating such information in a model.

The existing C_comp subparameter does not specify how it should be =
connected
between the I/O pad and the supply rails.  Most naturally it will end =
up
getting connected to the I/O node and ground.  However, since it not =
only
represents the capacitance of the pulldown device, but also the =
capacitance of
the pullup device, one should split it between the I/O pin and ground, =
and the
I/O pin and power rails.  One can easily see that this configuration =
forms a
series combination of two capacitances between power and ground.  =
Simulations
show a significant difference in the waveforms for the distributed or =
lumped
capacitance when power and ground nodes of the die are connected =
through the
package parasitics to the ideal power source(s).

Possible solutions

1)  Specify splitting factor coefficients
2)  Use a new subparameter under each voltage reference keyword
3)  Use a new subparameter under each I-V curve
4)  Use four new subparameters under the [Model] keyword (as presented =
in
    this BIRD).

************************************************************************=
******

ANY OTHER BACKGROUND INFORMATION:

Changed the names for the four C_comp* parameters as requested in the=20
12-08-2000 IBIS Open Forum Teleconference meeting.  Added the next=20
paragraph.

Transistors (consequently buffers) show different parasitic capacitance =
when
turned on or off.  Additional mechanisms need to be added to the IBIS=20
specification to account for these variations.

The voltage dependency of the die capacitance should also be addressed =
at some
point. (Use typ., min., max, capacitance vs. voltage tables instead of =
single
values)?

************************************************************************=
******

------_=_NextPart_000_01C08D5F.15355480--

 
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From: "Lorang, David D" <david.d.lorang@intel.com>
To: "'ibis@eda.org'" <ibis@eda.org>
Subject: Bird 68.1
Date: Fri, 2 Feb 2001 13:57:22 -0800 
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From: "Lorang, David D" <david.d.lorang@intel.com>
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Subject: Bird 68.1 Second Try
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************************************************************************=
******
************************************************************************=
******

                       Buffer Issue Resolution Document  (BIRD)


BIRD ID#:      68.1
ISSUE TITLE:   Clarify that Rising and Falling Waveforms Should be =
Correlated
REQUESTOR:     David Lorang, Intel
DATE SUBMITTED:                       October 24, 2000,`February 2, =
2001
DATE ACCEPTED BY IBIS OPEN FORUM:     Pending

************************************************************************=
*******
************************************************************************=
*******

STATEMENT OF THE ISSUE:

      Rising waveform data should be correlated with falling waveform =
data to
      help simulators provide accurate duty cycles for their output
      waveforms.

************************************************************************=
*******

STATEMENT OF THE RESOLVED SPECIFICATIONS:

Add the following new paragraph to the [Rising Waveform], [Falling
Waveform] Keywords in Section 6 before the paragraph that starts with, =
"A=20
[Model] specification can contain more that one rising edge...":

|               The data in all of the waveform tables should be time=20
|               correlated.  In other words, the edge data in each of =
the=20
|               tables (rising and falling) should be entered with =
respect to=20
|               a single point in time when the input stimulus is =
assumed to
|               have initiated a logic transition.  All waveform=20
|               extractions should reference a common input stimulus =
time in=20
|               order to provide a sufficiently accurate alignment of=20
|               waveforms.  The first line in each waveform table =
should be=20
|               assumed to be the reference point in time corresponding =
to a
|               logic transition.  For example, assume that some =
internal
|               rising edge logic transition starts at time =3D 0.  =
Then a
|               rising edge voltage-time table might be created =
starting
|               at time zero.  The first several table entries might=20
|               be some "lead-in" time caused by some undefined=20
|               internal buffer delay before the voltage actually =
starts=20
|               transitioning.  The falling edge stimulus--for the =
purpose of=20
|               setting reference time for the voltage-time =
curve--should also=20
|               start at time =3D 0.  And, the falling edge =
voltage-time table=20
|               would be created starting at time zero with a possibly=20
|               different amount of "lead-in" time caused by a possibly =

|               different--but corresponding--falling edge internal =
buffer=20
|               delay.   Any actual device differences in internal =
buffer=20
|               delay time between rising and falling edges should =
appear as=20
|               differing lead-in times between the rising and the =
falling=20
|               waveforms in the tables just as any differences in =
actual=20
|               device rise and fall times appear as differing =
voltage-time=20
|               entries in the tables.=20



************************************************************************=
*******

ANALYSIS PATH/DATA THAT LED TO SPECIFICATION:

This change is necessary because errors in the relationship between =
rising and=20
falling edges cause duty cycle distortion in the simulated waveform. =20
Preserving the timing relationship between rising and falling edge =
timing is=20
important due to the effects of inter-symbol interference (ISI).  =
Intersymbol=20
interference can be thought of as the effect of the previous edge (and =
in fact=20
edges before that) on the signal quality of the current edge of a =
signal.  If=20
the timing between a previous and current edge is in error, then the =
ISI effect=20
will be inaccurate also.

Note that an I/O buffer specification characterizes the shape of a =
buffers=20
output waveform and does not and usually cannot, determine the internal =
delay=20
of that buffer.  It is the duty of a component data sheet to express =
the=20
timing relationships between its various I/O pins.   But the timing=20
relationship between an output buffer's own rising and falling edges is =

characterization of that output buffer and does fall within the realm =
of the=20
buffer's specification, and thus that timing relationship should be =
preserved,
if possible.

The specification makes it clear that multiple waveforms for a given =
signal=20
edge should be time correlated, but it does not specifically state that =

correlation should also be maintained between rising and falling edges. =



Consider the following example:

A buffer has the following measured Tco (Time Clock-to-output) values.

      Tco (rising edge):  2ns
      Tco (falling edge): 3ns

Suppose that we have measured waveforms as shown in the timing diagram =
below.


        0ns                 10ns                20ns

        |                   |                   |

         ___________________                     ____________________
        |                   |                   |                    |
        |                   |                   |                    |
   CLK  |                   |___________________|                    |

             ___________________                     _________________
            /                   \                   /
           /                     \                 /
 OUTPUT __/                       \_______________/


        |<->| TcoR =3D 2ns    |<-->| TcoR =3D 3ns


Although  IBIS modeling does not deal with Tco directly, it does model =
the=20
shapes of the waveforms.  For the measured information above, an IBIS =
model=20
might be created to provide the following rising and falling waveforms:


         Vfinal  ___         ___                =20
                            /
                           /
    Rising                /
                         /
                        /
       Vinitial  ___   /

       Vinitial  ___                  =20
                       \
                        \
    Falling              \
                          \
                           \
        Vfinal   ___        \___


                       |    |  |

                      T=3D0  T=3D2 T=3D3 (ns)


And if so, although the waveforms are the correct shape, a time domain=20
simulation would provide erroneous and misleading results:


               0ns                 10ns                20ns
      =20
               |                   |                   |

                ___________________                     =
____________________
               |                   |                   |                =
    |
               |                   |                   |                =
    |
          CLK  |                   |___________________|                =
    |

                    ___________________                     =
_________________
                   /                   \                   /
 Original OUTPUT  /                     \                 /
               __/                       \_______________/


               |<->| TcoR =3D 2ns    |<-->| TcoF =3D 3ns

                   ________________                       =
_________________
                  /                \                     /
Simulated OUTPUT /                  \                   /
                /                    \_________________/


                |-| TcoR =3D 1ns    |-| TcoF =3D 1ns


The timing diagram shows that the delay from clock to output has =
changed--and
that is OK because IBIS is not intended to specify that.  The problem =
is that=20
the rising and falling edges have changed by different amounts causing =
duty=20
cycle distortion of the simulated waveform.

A better handling of this situation would have the rising and falling=20
waveforms correlated so that for our example the IBIS V-T models would =
look=20
like this:


         Vfinal  ___         ___                =20
                            /
                           /
    Rising                /
                         /
                        /
       Vinitial  ___   /

       Vinitial  ___   ___               =20
                          \
                           \
    Falling                 \
                             \
                              \
        Vfinal   ___           \___


                       |  |  |  |

                     T=3D0 T=3D1 T=3D2 T=3D3 (ns)

With these waveforms when a time domain simulation is run, the waveform =
would=20
still have a different Tco than the original measurement, but because =
the=20
rising and falling edges are correlated, the output signal shape is =
accurate=20
(i.e. the simulated waveform no longer has the duty cycle distortion.)


               0ns                 10ns                20ns
      =20
               |                   |                   |

                ___________________                     =
____________________
               |                   |                   |                =
    |
               |                   |                   |                =
    |
          CLK  |                   |___________________|                =
    |

                    ___________________                     =
_________________
                   /                   \                   /
 Original OUTPUT  /                     \                 /
               __/                       \_______________/


               |<->| TcoR =3D 2ns    |<-->| TcoF =3D 3ns

                  ___________________                    =
_________________
                 /                   \                  /
Simulated OUTPUT/                     \                /
               /                       \______________/


               |-| TcoR =3D 1ns      |<->| TcoF =3D 2ns


In summary, the IBIS specification should maintain correlation between =
all=20
rising and falling waveforms to enable simulators that use the IBIS =
data to=20
provide accurate results.


************************************************************************=
*******

ANY OTHER BACKGROUND INFORMATION:

     =20
************************************************************************=
*******



------_=_NextPart_000_01C08D66.98610690--

 
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To: ibis@eda.org
Subject: EIA IBIS Summit Meeting Minutes


Date: 2/2/01

SUBJECT: 1/29/01 EIA IBIS Summit Meeting Minutes

VOTING MEMBERS AND 2001 PARTICIPANTS LIST:
3Com (& CommWorks)             Roy Leventhal
Agilent                        (Mark Chang)
Ansoft Corporation             (Eric Bracken)
Applied Simulation Technology  Raj Raghuram*, Norio Matsui*, Fred Balistreri*
Avanti                         (Chen Hongyu)
Brocade Communications         Robert Badal*
Cadence Design                 Ian Dodd*
Cisco Systems                  Syed Huq*, Lungfu Chen*
Compaq                         Peter LaFlamme*, Ron Bellomio*, Quang Dam*
Cypress                        (Rajesh Manapat)
EMC Corporation                Brian Arsenault*, Jinhua Chen*
Fairchild Semiconductor        Adam Tambone*
IBM                            Michael Cohen*, Greg Edlund, Wes Martin*,
                               Yeon-Chang Hahm*, Bill DeVey*
Innoveda (& HyperLynx)         Guy de Burgh*, John Angulo*
Intel Corporation              Stephen Peters*, Arpad Muranyi*, Dave Lorang,
                               Michael Mirmak, Qinglun Chen*, Will Hobbs* 
LSI Logic                      Larry Barnes*
Mentor Graphics                Bob Ross*, Tom Dagostino*, Chris Reid*, 
                               Mike Donnelly*, Hazem Hegazy*, Tony Dunbar*,
                               Griff Derryberry*, Dan Lake*, Sherif Hammad*,
                               Mohammed Korany*, Weston Beal*
Micron Technology              Randy Wolff, Yong Phan
Mitsubishi                     (Tam (Tom) Cao)       
Molex Incorporated             Gus Panella*, Brian O'Malley*
Motorola                       (Ron Werner)
National Semiconductor         Milt Schwartz*
Nortel Networks                Calvin Trowell
North East Systems Associates  Edward Sayre* 
Philips Semiconductor          Zack Ciccone*
Quantic EMC                    (Mike Ventham)
Robinson-Nugent, Inc.          (Alexander Barr)
Siemens AG                     Bernhard Unger*, Helmut Katzier*
SiQual                         Scott McMorrow*, Rob Hinz*, Bernard Voss*,
                               Chris Brewster*
Texas Instruments              Thomas Fisher*, Stephen Nolan*, Ramzi Ammar*
Time Domain Analysis Systems   Dima Smolyansky*, Steve Corey*
Tyco Electronics               (Russell Moser)
Via Technologies               (Weber Chuang)
Zuken (& Incases)              (Werner Rissiek)

OTHER PARTICIPANTS IN 2001:
Actel Corporation              Silvia Montoya*
Acuson                         Kim Helliwell*
AMCC                           Jeff Smith*
Apple Computer                 John Figueroa*             
ASIS Ltd                       David Wright*
EIA                            Cecilia Fleming
FCI                            Sercu Stefaan*
Foundary Networks              Bertram Chan
Framatom Conectors             Danny Morlion*
Fujitsu Ltd                    Tadashi Arai*, Takeshi Murakami*
Huawei Technologies            Rachild Chen* 
Hyundai Electronics            Jongho Kang*
Intrinsix Corporation          Steven Chin*
Nokia                          Tapani von Ravner*
Oak Technology                 Darmin Jin*
Plexus Technology Group        Joseph Socha*
Signal Integrity Software      Douglas Burns*, Barry Katz*, Walter Katz*
STMicroelectronics             Peter Hirt*
Xilinx                         Susan Wu*
Independent, Consultant        Al Davis*

In the list above, attendees at the meeting are indicated by *. Principal
members or other active members who have not attended are in parentheses.
Participants who no longer are in the organization are in square brackets.

Upcoming Meetings:  The bridge numbers for future IBIS teleconferences are as
follows:

  Date                Bridge Number    Reservation #    Passcode
  February 16, 2001   (916) 356-9200   2-508083         4216977
  March 2, 2001       (916) 356-9200   2-508084         6782941
  March 16, 2001      European IBIS Summit Meeting - No Phone Bridge

All meetings are 8:00 AM to 9:55 AM Pacific Time.  We try to have agendas out
7 days before each Open Forum and meeting minutes out within 7 days after.
When you call into the meeting, ask for the IBIS Open Forum hosted by Will
Hobbs and give the reservation number and passcode.

NOTE: "AR" = Action Required.

-------------------------------- MINUTES -------------------------------------
INTRODUCTIONS AND MEETING QUORUM
The IBIS Summit Meeting was held in Santa Clara, California at the Santa Clara
Convention Center.  About 72 people representing 35 organizations attended.
The notes below capture some of the content and discussions.  The meeting
presentations and other material will be uploaded at:

  http://www.eda.org/pub/ibis/summits/jan01/

Bob Ross opened the meeting by asking everyone to introduce themselves.  The
group was well represented by Semiconductor and EDA tool vendors and users of
IBIS models.  Also several people from EDA commercial IBIS model providers
and EDA consultants attended.  Several people were also involved in other
official standards bodies, some of which are considering using IBIS models
for simulation models.

Bob thanked DesignCon for providing the meeting room, refreshments and the
Booth as part of our Associate Sponsorship of DesignCon.  The IBIS Open Forum
is mentioned in the literature.  Bob thanked National Semiconductor for
providing the hot lunch and Milt Schwartz for taking care of the local
arrangements including providing copies of the presentations.  Bob thanked
Applied Simulation Technology for loaning an LCD projector.  Bob thanked 
Guy de Burgh and Innoveda for taking care of the booth backdrop and handling
the member signs.  The IBIS Booth is #861 on the show floor.  Finally, Bob 
thanked the presenters and participants for attending.


IBIS TODAY
Bob Ross, Mentor Graphics
Bob Ross briefly noted the current IBIS activity:

  Ongoing Version 3.2 activity including ibischk3 Version 3.2.6 and more
    BUG processing.
  IBIS Version 4.0 BIRDs being processed
  Connector Specification (Version 0.960 has been uploaded)
  Future "IBIS-X"

We are also tracking other activities including EIAJ IMIC progress, JEDEC 
activity and European TC93 WG6 EMC/EMI activity.  We are also noting that
there may impacts from other standards.

The meeting today progresses from present to futures:

  Current IBIS Model Development and Validation
  Future Needs
  Connector Specification Progress and Discussion
  Future IBIS-X Progress and Discussion
  Other Topics and Discussions

Bob then asked for any new topics.  Ian Dodd's report on HTML format for IBIS
will included as part of another presentation.


IBIS DOCUMENTATION FOR ACME ENGINEERING
Scott McMorrow, Siqual Corporation
Because of equipment availability, Scott McMorrow started first.  He stated
that his presentation was a reduced form of an actual report on a model he
developed for a customer (with names changed).  It shows a process for 
developing and validating IBIS models.

The first problem is gathering all of the specification and Spice model
information.  Sometimes initial information is incomplete, so this process 
may take several weeks.  The IBIS model are developed by using internal tools
based on improvements to the North Carolina State University s2ibis2 utility.
Once completed, the model is checked against several test circuits similar 
to those in the IBIS Accuracy Report.  In particular a transmission line with
a small capacitive loads are used.   The Figures of merit similar to those
in the Report are given with the model.  Scott expects values in the range
of 97% to 99% for released models.

Scott mentioned that the major EDA simulators that process IBIS models give
essentially the same results.  He showed examples of IBIS buffer simulation 
overlayed with Spice model simulation.  Some differences were based on DC 
errors in the I-V data.  Sometimes waveform mismatch between some expected
DC starting and ending values and those documented in the waveform tables
caused some overshoot glitches.  The other main source of mismatch were
related to the number of points in the V-T tables.  IBIS has an overall 100
point limit that sometimes must be allocated between the different time
shifted typ, and max columns.  He had observed that with 33 points he may
get 6% error in correlation.  Scott indicated that, if necessary, more
points can be extracted and 100 points per column and can achieve 99% 
correlation.  With 256 points, correlation is excellent and delays are
with picoseconds.

Scott extracts the die capacitance from the model.  A wrong die capacitance
provides the second largest source of error, especially at the receiver
where the reflected amplitude is doubled.  He described two methods.  One
is based on the response to a current source.  The other is based on
simulation of a driver and receiver and use Spice to find the value through
optimization.

Scott illustrated these points by showing overlaying Spice simulation and
IBIS model simulation examples and noting some of the mismatch details and
the probable reasons for the deviations.

Scott agreed with a comment from a participant that the correlation metric
number itself could depend on the length of the period (and the corresponding
amount of overlaying data).  Visual inspection for differences should also
be done.  Scott concluded that IBIS model simulation can be as accurate as
Spice model simulation.  Other variables such as actual board impedances
contribute far more deviation in actual measurement to simulated results than 
the accuracy deviations discussed in the correlation study.

                                                                      
THE JOY OF WEB MODELS
Tom Dagostino, Mentor Graphics
A customer had asked Tom Dagostino to "QC" (do a quality control check) a set 
of IBIS models needed for a project.  About 20 of them were obtained directly 
from semiconductor web sites.  Most actually were quite acceptable and may 
have needed only minor, easy to do addition or corrections such as adding 
threshold and timing values to some models.  However, Tom had three really
bad examples to share.  The model names and vendor names were changed to 
protect the guilty!

While the review process involves more steps, the models illustrated in the 
presentation failed either or both the ibischk3 and visual inspection check.  
The first model was a clock driver that had serious ibischk3 mismatches for 
rising and falling waveforms and I-V data.  Visual inspection revealed that 
the pulldown table had zero current in the active region, as the source to 
the problem.  A visual inspection also revealed that C_comp value was 
constant for all three cases: typ, min, and max.  Tom reported these problems 
to the manufacturer, and after the second call he received a corrected model 
that was satisfactory.

The second model was documented as a SCSI terminator.  It passed ibischk3
with zero errors.  However the model type was listed as Output complete
with [Pulldown] and [Pullup] tables and [Ramp] data.  The manufacturer has 
been contacted and stated that they would pass the information on.  However, 
the manufacturer has not responded.

The third component had at least several bad models.  A model named as an
_in model with a signal_name and Model_type Output had ibischk3 waveform 
errors.  Closer investigation showed a number of interesting aspects:  Vinh
and Vinl were defined; the typ, min, max temperatures were not correct; and
the I-V table data contained zeros in the normal operating regions.  Also,
the [Ramp] data contained zeros.  Another _in model was documented as an I/O 
model with weak [Pullup] and [Pulldown] data and more [Ramp] data problems 
including negative time.  Another had a constant voltage [Falling Waveform] 
table.  A model, really documented as an _out model, had meaningless and 
unrealistic conditions regarding the content of the data: a "rough
approximation" to lab measurements, and a max condition that was not
consistent with the IBIS definitions.  It passed ibischk3, but with waveform
warnings.  One source of warning was a repeated voltage value.  Some tables
had strange values inconsistent with typ, min, and max values.  This time the 
[Pulldown] table had -0A values and [Ramp] data values of 0.  For this
component, the manufacturer has not yet responded to Tom's feedback.

Tom concluded that some model developers need to do a better job in making
models and QC'ing them before they are released.


LVDS MODELING
Hazem Hegazy and Mohammed Korany, Mentor Graphics
Mohammed Korany reported on the problems associated with creating IBIS models
for LVDS differential driver buffers with internal differential terminations.
The basic problem is to extract the proper DC I-V data.  He reviewed several
existing methods and then two new proposals.  The last proposal gave the best
results.

First Mohammed reviewed LVDS.  He then reviewed two methods that have been
proposed.  The first one dealt with a voltage sweep at PAD with PADN
connected to R_load and Vref.  The second method used a mirrored negative
current source at PADN.  A third method was also presented where mirrored
delta voltages are applied at PAD and PADN.  All of these methods worked for
50 ohm loads and provided nearly overlaying IBIS and Spice simulations.  Some
DC offset was observed with 100 ohm terminations.  However, all methods gave
DC offsets when internal differential terminations existed in the LVDS model.
Mohammed accounted for these offsets by showing the mathematical distribution
of currents during extraction of the model.

Proposal I was similar to Method 3, but had the voltages attached to a Vmid
value derived from averaging the low and high state voltages.  This produced
better results but still showed DC differences with internal terminators and
the load equal to 100 ohms.  It only supported the using the R_fix value
load.

Proposal II used mirrored resistance changes with resistors connected to the
Vref value.  This produced overlaying simulations for all cases.  Mohammed
showed overlaying simulations with a test circuit where the differential,
internally terminated buffer was driving a lossy, coupled differential line
into a receiver load.  The results overlaied well for all differential
conditions.

Mohammed noted that one could remove the internal differential resistor as
another approach.  Bob Ross noted that we may not know exactly the internal
resistor (if the driver does not have a high Z or input mode or if the Spice
model is encrypted).

Several people noted that the examples showed larger differential voltage
swings than specified for LVDS.  Mohammed stated that this was from an ASIC
produced by one vendor.  The methods discussed are applicable to LVDS.

Arpad Muranyi (several methods were referenced from his class material)
stated that this was good information.  He never did consider the impact of
internal differential terminations.

Ed Sayre stated that even other terminations including AC terminations may
exist.  It is important to get the model correct for DC and AC responses.

Mohammed concluded that LVDS IBIS modeling needs high DC resolution


LSI POWER AND GROUND MODEL FOR EMI SIMULATION
Norio Matsui, Applied Simulation Technology and Hiroshi Wabuka, NEC
Norio Matsui introduced the problem by showing several simulation comparisons
between IBIS Simulation, table Spice (IMIC) simulation and Spice (all done
using the Applied Simulation Technology tool.  Standard simulation of LVDS
and PECL circuits work well.  However, IBIS loses some detail with internal
inverter circuits and also does not produce the same simultaneous switching
output (SSO) responses for currents and voltages.  ICs with complex internal
structures cause unaccounted internal currents that need to be added to the
model for ground and power modeling and EMI.

For large scale integration (LSI), the conventional IBIS structures can be
used for input and output.  An internal current circuit is added between the
input and output structures.  Such an internal structure might represent a
clock macro.  The techniques for macro modeling can be:

  I/O        IBIS or IMIC for I/O + Package
  Clock      10% consumes most power (highest frequency)
  Non Clock  Behaves a filters/decoupling capacitors

Norio described the procedures for macro modeling and showed some Spice
and table Spice structures and also some IBIS EBD and IBIS I/O structures.
The clock and non-clock model can be realized using a cascaded double IBIS
I/O for the dynamic portion and a set of RC networks for the non-clock static
portion.  Norio showed a final circuit containing double inverters for the
middle stage.

Using this approach, Norio showed accurate correlation between the IBIS/EBD 
and table Spice (IMIC) models for current waveforms.  There was some loss in
accuracy when he simplified the model using only four IMIC transistors.  Norio
also showed accurate comparisons simulated and measured peaks of near field 
EMI.

Arpad Muranyi questions whether splitting C_Comp into components to different
rails might improve the accuracy for the simplified model.  Also die
interconnect details were not simulated in this study.


SCSI COMPENSATION MODELING
Larry Barnes, LSI Logic
Larry Barnes introduced himself as co-chair and technical editor of a Ad hoc
Working Group involved in T10.  T10 is a Technical Committee of the National 
Committee for Information Technology Standards (NCITS).  It was formerly 
known as the X3 Committee.  NCITS is accredited by and operates under rules
approved by ANSI.  Larry showed the membership and gave some background on
the Small computer Systems Interface (SCSI).  

A technical synopsis of SCSI configurations include:

  Bus structure with 27 data, 8 ground, 4 termination power, 2 reserved lines
  68 conductors, 90 - 120 ohms, single ended or differential
  25 meters point-to-point
  12.5 meters with 16 stubs
  Allowable loading of 30 pF / stub

Larry presented a number of issues that produce data errors associated with 
320 MBytes/second transfer rates, decreased setup and hold time, intersymbol 
interference, decreased cable charge time, and 16 capacitively loaded stubs.
The eye diagram without compensation has decreased, and the worse case
situation has no opening.

Larry proposes a solution which produces a very acceptable eye diagram:

  Run length encoded compensation at the transmitter
    Transmitter overdrives unless two or more data bits are sequentially
      the same value
    Second data bit and subsequent bits of the same value have the drive
      level reduced
    Drive strength, rise time and fallback are programmable
  Training pattern upon initialization with bit rate negotiation

Larry is writing an ANSI/NCITS Technical Report on SCSI Signal Modeling to
document the details of the solution.  The Working Group has selected IBIS a 
the data exchange format for:

  Semiconductor device models
  Termination models
  Connector models (when codified)

The Working Group would like to continue to use IBIS if fallback modeling
can be accomplished.  Currently IBIS Version 3.2 can be used for SCSI devices 
for:

  Single-ended models
  High voltage differential models
  Low voltage differential models

SCSI 320 Mbyte/s driver characteristics require a fallback model:

  Differential current mode transmitters
  Negotiable data rates
  Multi-level parallel positive and negative current drivers
  Uses programmable fallback

Fallback cannot be modeled in IBIS Version 3.2: 

  Driver schedule keyword is close
  Needs bit position dependency, not time
  Future may include overdrive past first bit
  Needs accommodation for parallel current mode drivers

Larry proposes adding a [Fallback Schedule] keyword:

  Similar in construction to [Driver Schedule]
  Describes switching sequence fallback modeling
  Delay parameters are in terms of bit times
  Accommodates typ, min, max conditions
  Differential operation
  Two current sources and sinks for each line

This will cover the next generation of SCSI and IBIS futures through 2003.
Subsequent generations may include phase encoding.  Larry hopes that this
will fit in the future of IBIS.

Larry welcomes IBIS participation in this Working Group.  A draft work in
progress specification is available at:

  http://www.t10.org


LUNCH
The Group broke for a delicious buffet lunch sponsored by National 
Semiconductor.


CONNECTOR SPECIFICATION
Gus Panella, Molex
Gus Panella reported on the progress of the IBIS Connector Specification. 
There have been some delay because of the loss of a key member (Kellee
Crisafulli), limited participation, holidays, and working with a big
document.  However, the Working Group has been improving the descriptions
and clarifying ambiguous syntax.

Gus reported on some of the changes:

  Removal of Physical Map because of unnecessary complexity
  Distinction of Side_A and Side_B pin maps
  Clarification of [Redistribution] Specific to mean comments are in the
    Header section
  Some number of pins, rows, and columns ranges to document physical limits
  More [Cn_Row_Swath] and [Cn_Column_Swath] distinction and edge definitions
    and usage

Gus reported that Ian Dodd provided a C-style syntax to describe the pin
map information as a function of ROW and COLUMN entry specified by the EDA
tool.  Ian gave the brief description (given below) at this time.

Gus stated that the current discussions involve following the IBIS-X group
header suggestions, where practical.  These include bracketing the header
with [Begin Header] and [End Header] keywords.  Gus asked if the [Source]
keyword should be required.  It is not required in all other documents.  The
consensus was mostly in favor on not making it required after some meeting
discussion.  Gus also asked about using " " (space) or "_" (underscore)
between keywords, but this was clarified as an documentation editorial detail,
not a functional detail.  Both conventions will be supported.  The work in
progress (Version 0.960) of the Connector Specification has been uploaded for
review.

Gus closed by mentioning some short term goals.  He concluded that the 
document is reaching technical completion.  Bob Ross added that he plans to
release the document for full IBIS Committee technical review and comments
while the editorial cleanup of the document is being done.  The document will
go through formal review processes for EIA IBIS Open Forum approval, and
further review processes (including a 90 day formal public review) for EIA
ratification.


IBIS CONNECTOR SPECIFICATION: PRELIMINARY PROPOSAL FOR A PIN NAMING LANGUAGE
Ian Dodd, Cadence Design Systems
As part of the Connector Specification presentation, Ian Dodd displayed and
discussed aspects of a proposal for pin naming language.  The main points of
the proposal are:

  It adopts C - like code style including C style formatting statements
  It predefines certain variables ROW, COLUMN, SIGNAL_NAME, and PIN_NAME
  It presumes all variables are integers and do not need to be declared
  It has some simple math operations and conditionals
  It can easily specify incrementing characters through addition

Ian showed some applications including one where a row was missing.  He
stated that the proposal might be compatible with the IBIS-X macro language.
One issue is whether they should be aligned.  The text formatting might be
needed for the macro language.  One pending decision is whether the C style 
of ending lines with semicolons should be done in the pin naming language.


AN API FOR IBIS??
Al Davis, Consultant
Al Davis gave an informative presentation on an application programmable
interface (API) for IBIS.  He defined an API as:

  A binary interface for models
  It supports portable models external to the simulator
  It provides the ultimate generality and intellectual property protection

Al listed a number of issues:

  Type of interface
  Operating System differences
  Language differences
  Simulator differences
  Uses beyond simulation
  Hard to make portable (easy for one simulator)

The interface can be dynamically linked object modules (faster, but harder
to develop and less portable) or a separate application or applet (slower,
but more general and portable).  Al prefers the executable approach.  He
listed some advantages and issues.  It should support different types of
simulators ranging from Spice-like, mixed-mode, transmission line / tree
based, gate level, and HDL.  It should also support more than one simulation.
There was some discussion on whether API's would be repeated if the model
was used several times.  This needs to be clarified.

The functions needed for an API are:

  Parsing and printing the calling netlist
  Pre-processing
  Predictor step
  Evaluation
  Gather and scatter
  Review step (iteration and step control)
  Probes
  Status queries
  Plus about a dozen more

Normally the user would use other tools to write the functions including
VHDL-AMS, IBIS-X, etc.  The simulator developers would do the work since
the complete understanding of simulator internals is needed.

Al concludes that an API is needed, but it will take coordination between
EDA companies.  It has potential beyond IBIS.


IBIS FUTURES GROUP UPDATE ON IBIS-X
Stephen Peters, Intel Corporation
Stephen Peters, who is serving as Chair or the IBIS Futures Working Group
introduced the progress on IBIS-X.  He listed the goals:

  Provide extensible syntax
  Enable complex/coupled package descriptions
  Maintain backwards compatibility (IBIS Version 3.2)
  Support some additional requirements (equation based modeling, HTML viewing,
    public key encryption)

Briefly, IBIS-X provides the following:

  Nodal based package description (die interconnect pin to pad, power
    delivery, and pin coupling)
  Macro language for creating new model types

The current status is:

  Al Davis has implemented IBIS Version 3.2 in a macro language
  The Working Group meets bi-weekly on writing a formal specification:
    Overall IBIS-X Specification
    Library Guide
    Programmers Language Reference Manual (LRM) expected in months
  Work remains on the die interconnection section

Stephen introduced some current issues:

  Alignment with the Connector Specification
  Case sensitivity in .ibs files (need to create rules for capitalization
    if it is supported.
  HTML support
  Support of more general equations and black boxes such as the Berkeley
    Spice B element
  Where does the API fit into this?

(Later Al Davis raised the case sensitivity issue with the group.  The
majority indicated preference for removing the requirement.)


PROPOSED NEW DIRECTIONS FOR IBIS PCB SIGNAL INTEGRITY MODELS
Ian Dodd, Cadence Design Systems
Ian Dodd provided an overview of IBIS today and future needs.  He gave the 
brief history of IBIS development and features and described its well-known
modeling advantages.  He also listed some limitations:

  Feature changes require the slow process of adding new keywords
  The rate of requests for feature changes is accelerating
  Models assume a fixed topology
  The present standard is inadequate for todays needs in:

    Input transition detection
    Simultaneous switching noise
    Power delivery
    Coupling within packages

Ian listed a number of goals, similar to those discussed by Stephen Peters.
IBIS-X for the next generation should:

  Extend the data sheet
  Add a new structure template

Ian illustrated the extended data sheet (similar to IBIS) and noted the
structure details and topology.  He also listed a number of circuit elements
for IBIS-X

Ian also discussed and illustrated how IBIS and IBIS-X can be made compatible
with HTML.  A feature is that lines with "<" in column one are assumed to be
HTML formatting commands.  Some details have to be worked out regarding some
initial declarations.  HTML can also be used to add separate graphics file
pictures within IBIS files.  Ian illustrated doing this using a portion of
an example provide by Stephen Nolan.  Scott McMorrow raised the concern that
the Working Group might be working on fluff and not dealing with the critical
issues.  Ian responded that this issue was really not taking much time.

Ian listed and discussed a number of advantages of IBIS-X: 

  Extensible
  Allows reuse of structural template
  Data is separated from templates 
  Devices in a wide range of logic families can share structural templates
  Can read existing IBIS models
  Nodal structure allows multiple levels of abstraction

He also listed some concerns:

  High expertise is needed to create new IBIS-X templates
  Model developers will need to create more than one type of data sheet
  Simulation tools will have to be more intelligent in syntax checking.
  Model validation will be more difficult.
  
Ian listed the future IBIS-X work and noted that there are still some open 
issues and concerns regarding the level of abstraction and whether exiting
standards can be used.  Ian concluded that IBIS-X is promising, but it will
require increased sophistication of validation tools and training for model
developers.


IBIS-X PROGRESS REPORT
Al Davis, Consultant
Al Davis listed the progress:

  Some documents
  Working parser
    Tested with about 100 IBIS files
    Some bugs
    Generates partial Spice deck

Al's goals are

  Doing simulations by March
  Also include the Connector Specification
  Produce a presentable version of the Specification by March

He currently has a working demonstration.  It can be downloaded (pre-alpha
code for review).  It can be found at:

  http://table.jps.net/~atd/ibisx.200101.tar.gz


IBIS-X MACROLANGUAGE
Al Davis, Consultant
Al Davis reviewed a previous presentation on IBIS X.  He stated that the
basic simulator requirements were:

  Handling piece-wise linear (PWL) constructs
  Handling two-dimensional PWL tables (time and signal)
  Having a "trigger" to shift time tables

Additional elements include generalized expressions for

  Voltage, current, charge, flux
  Multi-port block

IBIS-X supports structure (a spice like description with expressions).  IBIS
already contains data with data sheet like information for tables and
attributes.  These were illustrated.

Other structures Al illustrated were conditionals (if), time dependent tables 
and triggers, an IBIS compatible driver element, a new foreach statement, and
an alarm, and value expression.

A number of points were discussed including having a floating gnd versus 
absolute 0 voltage ground and having $ before variables.


CONCLUDING ITEMS
Bob Ross again thanked the sponsors of the meeting and also the presenters 
and participants.

Bob stated that the next teleconference meeting is planned for Friday,
February 16, 2001, and the following one on March 2, 2001.  Actions are still 
needed for issuing BIRD65.2 and BIRD68.1 prior to voting on these.  

Bob reminded us that the European IBIS Summit Meeting is scheduled for
Friday, March 16, 2001 in Munich Germany in a hotel near the Design Automation
And Testing in Europe DATE 2001) conference and exhibition.
The four co-sponsors are Cadence Design, Innoveda, Mentor Graphics, and Zuken
(Incases).  The first notice was sent out at the end of January 2001.  So
far Bob has about three or four presentations proposed so far, so he expects
this to be an all day meeting with a free lunch to participants.

Bob asked if there were any questions or issues to discuss briefly.  Kim
Helliwell asked about what was happening to the s2ibis3.  Michael Cohen
commented that after much debate we decided not to seek funding on the
project because it would create a product that already competed with a
commercial product.  Bob added that there were other commercial modeling
services as well.  However, the project specification is still uploaded, and
anyone can still work on it.


NEXT MEETING:
The next teleconference meeting will be on Friday, February 16, 2001 from
8:00 AM to 10:00 AM.  BIRD65.2 and BIRD68.1 are scheduled for a vote if
ready.
==============================================================================
                                      NOTES

IBIS CHAIR: Bob Ross (503) 685-0732, Fax (503) 685-4897
            bob_ross@mentor.com
            Modeling Engineer, Mentor Graphics
            8005 S.W. Boeckman Road, Wilsonville, OR 97070

VICE CHAIR: Stephen Peters (503) 264-4108, Fax: (503) 264-4515
            stephen.peters@intel.com
            Senior Hardware Engineer, Intel Corporation
            M/S JF1-209
            2111 NE 25th Ave.
            Hillsboro, OR 97124-5961

SECRETARY:  Guy de Burgh (805) 988-8250, Fax: (805) 988-8259
            gdeburgh@innoveda.com
            Senior Manager, Innoveda
            1369 Del Norte Rd.
            Camarillo, CA 93010-8437

LIBRARIAN:  Roy Leventhal (837) 797-2152, Fax: (847) 222-2799
            roy_leventhal@3com.com
            Senior Engineer, CommWorks Corp. (a wholly owned 3Com subsidiary)
            1800 W. Central Rd.
            Mt. Prospect, IL 60056-2293

WEBMASTER:  Syed Huq (408) 525-3399, Fax: (408) 526-5504
            shuq@cisco.com
            Manager, Hardware Engineering, Cisco Systems
            170 West Tasman Drive
            San Jose, CA 95134-1706

POSTMASTER: John Angulo (425) 869-2320, Fax: (425) 881-1008
            jangulo@innoveda.com
            Development Engineer, Innoveda
            14715 N.E. 95th Street, Suite 200
            Redmond, WA 98052

This meeting was conducted in accordance with the EIA Legal Guides and EIA
Manual of Organization and Procedure.

The following e-mail addresses are used:

  ibis-request@eda.org
      To join, change, or drop from either the IBIS Open Forum Reflector
      (ibis@eda.org), the IBIS Users' Group Reflector (ibis-users@eda.org)
      or both.  State your request.

  ibis-info@eda.org
      To obtain general information about IBIS, to ask specific questions
      for individual response, and to inquire about joining the EIA-IBIS
      Open Forum as a full Member.

  ibis@eda.org
      To send a message to the general IBIS Open Forum Reflector.  This
      is used mostly for IBIS Standardization business and future IBIS
      technical enhancements.  Job posting information is not permitted.

  ibis-users@eda.org
      To send a message to the IBIS Users' Group Reflector.  This is
      used mostly for IBIS clarification, current modeling issues, and
      general user concerns.  Job posting information is not permitted.

  ibischk-bug@eda.org
      To report ibischk2/3 parser bugs.  The Bug Report Form Resides on
      eda.org in /pub/ibis/bugs/ibischk/bugform.txt along with reported bugs.

      To report s2ibis, s2ibis2 and s2iplt bugs, use the Bug Report Forms
      which reside under eda.org in /pub/ibis/bugs/s2ibis/bugs2i.txt,
      /pub/ibis/bugs/s2ibis2/bugs2i2.txt, & /pub/ibis/bugs/s2iplt/bugsplt.txt
      respectively.

Information on IBIS technical contents, IBIS participants, and actual
IBIS models are available on the IBIS Home page found by selecting the
Electronic Information Group under:

  http://www.eigroup.org/ibis/ibis.htm

Check the pub/ibis directory on eda.org for more information on previous
discussions and results.  You can get on via FTP anonymous.
==============================================================================

 
From owner-ibis Wed Feb  7 10:59:54 2001
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From: Al Davis <aldavis@ieee.org>
To: <ibis@eda.org>
Subject: Re: BIRD 65.2
Date: Wed, 7 Feb 2001 10:55:37 -0800
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(Most of this message is a repeat, because the issues have not been 
addressed.)

I have some questions and reservations on this.  To summarize, although 
I agree that such a thing is needed, this proposal does not solve the 
problem adequately and has the potential for introducing problems that 
have not been considered.  Also, the problem it intends to solve 
becomes a non-issue once IBIS-X is completed.

The first question is how difficult it is to implement.  Ordinarily, I 
would say that it is necessary to prove it with a prototype, but it is 
a simple topology change, so it would be no worse than the existing 
C_comp.  Incidentally, the C_comp as we know it is rarely implemented 
correctly for driving models.  It is very difficult to do correctly.  
The implementations tend to be very good for non-driving models, where 
it is just a simple capacitor.  In any case, it is no worse than what 
we have so I am satisfied on this point.

Still, testing is a problem.  How do you measure it?  How do you 
validate that the measured data actually relates to reality?  Before 
approval of this bird, I would like to see a description of a procedure 
for measuring it, and a procedure for validating that the measured data 
is actually correct and useful.  These procedures should be tried on a 
prototype.

The purpose is stated to be information on how the capacitance is 
distributed over the 4 ground/power nodes.  Another way to look at it 
is how the current in the capacitance is distributed.  OK.  Now back 
up.  We have pullup/pulldown and the clamps for the DC conditions.  The 
proposed c_comp's are the dynamic parts.  Existing models usually do 
not model the split of these correctly.  The pullup and power clamp are 
sort of in parallel, so the measurement is usually to measure the 
clamps in input or tri-state mode, and the pullup/pulldown in driving 
mode, by measuring a total and subtracting off the clamps.  This often 
leads to the pullup/pulldown showing strange bahavior when it is masked 
by the clamps, because the subtraction magnifies the errors.  In any 
case, the current path is not necessarily as intended.  The standard 
provides the mechanism to properly model the current paths, but most 
models do not.  They arbitrarily mix them.

Given that most models do not get the DC split correct, what justifies 
even trying for the dynamic part?

The next issue is that this capacitance is strongly nonlinear.  
Measuring it in the various states produces very different results.  
Even then, there is no hint at what they do during the transition, 
other than that the wave tables include the effect.  The wave tables do 
not provide information on how that current is distributed to the 4
power/ground nodes, and possibly also to other connection nodes 
including input and enable.

The nonlinear nature of this capacitance is significant in the 
development of the simulator algorithms.  Some actual models will only 
work accurately when the capacitance is treated as nonlinear.

Part of this capacitance is already in the standard as transit time.  
The [TT*] parameters are essentially equivalent to the C_comp_power and 
C_comp_ground parts, complete with the nonlinear component.  Thus, part 
of what this bird proposes is already available.  (OK -- the bird asks 
for the linear part.)  Do you have any examples of actual models that 
use these parameters?  with test data showing the quality of 
correlation to the real device?  How many simulators support it fully?  
It has been in the standard for a long time.

Considering the number of unanswered questions, and that this 
functionality and much more will be available in IBIS-X, I think it is 
best not to rush into this.

So, Arpad, you should prototype this in IBIS-X (trivial) , and also 
prototype a measurement system for it in IBIS-X (not so trivial).  This 
will validate both this bird and IBIS-X.  The rest of us should wait 
for the answer.

Note to readers not familiar with IBIS-X:  This is a proposed future 
IBIS based on a macro language.  It is fully backward compatible with 
IBIS as we know it, and provides the capability to add extensions like 
this one easily.  Arpad and I are both on the sub-committee that is 
working on it.  A prototype implementation of IBIS-X is being built, 
and a partial one (incomplete work in progress) is available for review 
to the committee and to those interested.

The change in wording of the "required" section is an improvement, but 
it still needs work.

How about:

Either the C_comp parameter or all four of C_comp_pullup, 
C_comp_pulldown, C_comp_power, and C_comp_gnd are required.  If C_comp 
is provided, the others are not allowed.
 
From owner-ibis Wed Feb  7 23:53:49 2001
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From: "Dagostino, Tom" <tom_dagostino@mentorg.com>
To: "'Al Davis'" <aldavis@ieee.org>, ibis@eda.org
Subject: RE: BIRD 65.2
Date: Wed, 7 Feb 2001 23:49:42 -0800 
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Re: required C_comp

In stead of requiring all 4 values of C_comp (you don't need C_comp_pullup,
etc with an open drain driver) require the appropriate C_comp for every IV
table in the model.

Tom Dagostino
IBIS and Tau Modeling Manager
SDD
Mentor Graphics Corp.
503-685-1613
tom_dagostino@mentor.com


-----Original Message-----
From: Al Davis [mailto:aldavis@ieee.org]
Sent: Wednesday, February 07, 2001 10:56 AM
To: ibis@eda.org
Subject: Re: BIRD 65.2


(Most of this message is a repeat, because the issues have not been 
addressed.)

I have some questions and reservations on this.  To summarize, although 
I agree that such a thing is needed, this proposal does not solve the 
problem adequately and has the potential for introducing problems that 
have not been considered.  Also, the problem it intends to solve 
becomes a non-issue once IBIS-X is completed.

The first question is how difficult it is to implement.  Ordinarily, I 
would say that it is necessary to prove it with a prototype, but it is 
a simple topology change, so it would be no worse than the existing 
C_comp.  Incidentally, the C_comp as we know it is rarely implemented 
correctly for driving models.  It is very difficult to do correctly.  
The implementations tend to be very good for non-driving models, where 
it is just a simple capacitor.  In any case, it is no worse than what 
we have so I am satisfied on this point.

Still, testing is a problem.  How do you measure it?  How do you 
validate that the measured data actually relates to reality?  Before 
approval of this bird, I would like to see a description of a procedure 
for measuring it, and a procedure for validating that the measured data 
is actually correct and useful.  These procedures should be tried on a 
prototype.

The purpose is stated to be information on how the capacitance is 
distributed over the 4 ground/power nodes.  Another way to look at it 
is how the current in the capacitance is distributed.  OK.  Now back 
up.  We have pullup/pulldown and the clamps for the DC conditions.  The 
proposed c_comp's are the dynamic parts.  Existing models usually do 
not model the split of these correctly.  The pullup and power clamp are 
sort of in parallel, so the measurement is usually to measure the 
clamps in input or tri-state mode, and the pullup/pulldown in driving 
mode, by measuring a total and subtracting off the clamps.  This often 
leads to the pullup/pulldown showing strange bahavior when it is masked 
by the clamps, because the subtraction magnifies the errors.  In any 
case, the current path is not necessarily as intended.  The standard 
provides the mechanism to properly model the current paths, but most 
models do not.  They arbitrarily mix them.

Given that most models do not get the DC split correct, what justifies 
even trying for the dynamic part?

The next issue is that this capacitance is strongly nonlinear.  
Measuring it in the various states produces very different results.  
Even then, there is no hint at what they do during the transition, 
other than that the wave tables include the effect.  The wave tables do 
not provide information on how that current is distributed to the 4
power/ground nodes, and possibly also to other connection nodes 
including input and enable.

The nonlinear nature of this capacitance is significant in the 
development of the simulator algorithms.  Some actual models will only 
work accurately when the capacitance is treated as nonlinear.

Part of this capacitance is already in the standard as transit time.  
The [TT*] parameters are essentially equivalent to the C_comp_power and 
C_comp_ground parts, complete with the nonlinear component.  Thus, part 
of what this bird proposes is already available.  (OK -- the bird asks 
for the linear part.)  Do you have any examples of actual models that 
use these parameters?  with test data showing the quality of 
correlation to the real device?  How many simulators support it fully?  
It has been in the standard for a long time.

Considering the number of unanswered questions, and that this 
functionality and much more will be available in IBIS-X, I think it is 
best not to rush into this.

So, Arpad, you should prototype this in IBIS-X (trivial) , and also 
prototype a measurement system for it in IBIS-X (not so trivial).  This 
will validate both this bird and IBIS-X.  The rest of us should wait 
for the answer.

Note to readers not familiar with IBIS-X:  This is a proposed future 
IBIS based on a macro language.  It is fully backward compatible with 
IBIS as we know it, and provides the capability to add extensions like 
this one easily.  Arpad and I are both on the sub-committee that is 
working on it.  A prototype implementation of IBIS-X is being built, 
and a partial one (incomplete work in progress) is available for review 
to the committee and to those interested.

The change in wording of the "required" section is an improvement, but 
it still needs work.

How about:

Either the C_comp parameter or all four of C_comp_pullup, 
C_comp_pulldown, C_comp_power, and C_comp_gnd are required.  If C_comp 
is provided, the others are not allowed.
 
From owner-ibis Thu Feb  8 00:27:51 2001
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From: Al Davis <aldavis@ieee.org>
To: "Dagostino, Tom" <tom_dagostino@mentorg.com>, ibis@eda.org
Subject: Re: BIRD 65.2
Date: Thu, 8 Feb 2001 00:23:43 -0800
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On Wed, 07 Feb 2001, Dagostino, Tom wrote:
> .......(you don't need
> C_comp_pullup, etc with an open drain driver) .....

You don't?  It seems to me that real drivers can have capacitance 
there even if there is no transistor there.
 
From owner-ibis Thu Feb  8 00:38:05 2001
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From: "Dagostino, Tom" <tom_dagostino@mentorg.com>
To: "'Al Davis'" <aldavis@ieee.org>, ibis@eda.org
Subject: RE: BIRD 65.2
Date: Thu, 8 Feb 2001 00:33:58 -0800 
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I agree but it is not "required" to have 4 C_comp's to model this.

Tom Dagostino
IBIS and Tau Modeling Manager
SDD
Mentor Graphics Corp.
503-685-1613
tom_dagostino@mentor.com


-----Original Message-----
From: Al Davis [mailto:aldavis@ieee.org]
Sent: Thursday, February 08, 2001 12:24 AM
To: Dagostino, Tom; ibis@eda.org
Subject: Re: BIRD 65.2


On Wed, 07 Feb 2001, Dagostino, Tom wrote:
> .......(you don't need
> C_comp_pullup, etc with an open drain driver) .....

You don't?  It seems to me that real drivers can have capacitance 
there even if there is no transistor there.
 
From owner-ibis Thu Feb  8 08:40:35 2001
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From: "Mahoney, Margaret" <margaret.mahoney@unisys.com>
To: ibis@eda.org
Subject: Schottky Barrier Diode
Date: Thu, 8 Feb 2001 11:36:55 -0500 
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Hi,

Does anyone know how to model a Schottky Barrier Diode in IBIS?  If so, how?

Maggie Mahoney

 
From owner-ibis Thu Feb  8 09:54:04 2001
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From: "Mahoney, Margaret" <margaret.mahoney@unisys.com>
To: "Dunbar, Tony" <tony_dunbar@mentorg.com>
Cc: ibis@eda.org
Subject: RE: Schottky Barrier Diode
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Hi Tony,

I would like to model the Schottky diode as a 2 terminal device and be able
to model the reverse recovery time of the diode.  The model you sent is a
one terminal device, is there a way I could model it with two terminals?

Thanks for you help.
Maggie

-----Original Message-----
From: Dunbar, Tony [mailto:tony_dunbar@mentorg.com]
Sent: Thursday, February 08, 2001 12:13 PM
To: 'Mahoney, Margaret'
Subject: RE: Schottky Barrier Diode


Hi Maggie,

Diodes are relatively simple to model and a Schottky diode should not be any
different than a 'regular' diode, except it would have a lower knee voltage.
Presumably you have a datasheet to give you this type of information.

The attached file is a generic diode model that comes with the
Interconnectix (ICX) tools. Feel free to use it as the starting point for
your model and shift the V/I table info to suit your needs. If you need any
more help with it, please get back to me.

Regards,
Tony Dunbar
Mentor Graphics/ICX
Dallas, TX



-----Original Message-----
From: Mahoney, Margaret [mailto:margaret.mahoney@unisys.com]
Sent: Thursday, February 08, 2001 10:37 AM
To: ibis@eda.org
Subject: Schottky Barrier Diode


Hi,

Does anyone know how to model a Schottky Barrier Diode in IBIS?  If so, how?

Maggie Mahoney

 
From owner-ibis Thu Feb  8 10:18:47 2001
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From: "Baikuan Wang" <wangbk@sigrity.com>
To: <ibis@eda.org>
Subject: R_dut, L_dut and C_dut
Date: Thu, 8 Feb 2001 10:14:18 -0800
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Hi, IBIS exports,

Regarding V(t) curve, the following circuit is given including
R_dut, L_dut and C_dut. My question is:
The rising/falling waveform refers to Voltage at the node
between C_dut and L_fixture. Am I right? Can you comment?
Thanks.

Brian
Sigity, Inc.

|
|                      PACKAGE            |   TEST FIXTURE
|       _________                         |
|      |  DUT    |   L_dut   R_dut        | L_fixture  R_fixture
|      |  die    |---@@@@@--/\/\/\--o-----|--@@@@---o---/\/\/\-----
V_fixture
|      |_________|                  |     |         |
|                                   |     |         |
|                                   |     |         |
|                            C_dut ===    |        === C_fixture
|                                   |     |         |
|                                   |     |         |
|                                  GND    |        GND
|

 
From owner-ibis Thu Feb  8 10:26:31 2001
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From: "Muranyi, Arpad" <arpad.muranyi@intel.com>
To: ibis@eda.org
Subject: RE: Schottky Barrier Diode
Date: Thu, 8 Feb 2001 10:06:23 -0800 
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Did you check out how to use the "TT" parameter?

Arpad
====================================================

-----Original Message-----
From: Mahoney, Margaret [mailto:margaret.mahoney@unisys.com]
Sent: Thursday, February 08, 2001 9:49 AM
To: Dunbar, Tony
Cc: ibis@eda.org
Subject: RE: Schottky Barrier Diode


Hi Tony,

I would like to model the Schottky diode as a 2 terminal device and be able
to model the reverse recovery time of the diode.  The model you sent is a
one terminal device, is there a way I could model it with two terminals?

Thanks for you help.
Maggie

-----Original Message-----
From: Dunbar, Tony [mailto:tony_dunbar@mentorg.com]
Sent: Thursday, February 08, 2001 12:13 PM
To: 'Mahoney, Margaret'
Subject: RE: Schottky Barrier Diode


Hi Maggie,

Diodes are relatively simple to model and a Schottky diode should not be any
different than a 'regular' diode, except it would have a lower knee voltage.
Presumably you have a datasheet to give you this type of information.

The attached file is a generic diode model that comes with the
Interconnectix (ICX) tools. Feel free to use it as the starting point for
your model and shift the V/I table info to suit your needs. If you need any
more help with it, please get back to me.

Regards,
Tony Dunbar
Mentor Graphics/ICX
Dallas, TX



-----Original Message-----
From: Mahoney, Margaret [mailto:margaret.mahoney@unisys.com]
Sent: Thursday, February 08, 2001 10:37 AM
To: ibis@eda.org
Subject: Schottky Barrier Diode


Hi,

Does anyone know how to model a Schottky Barrier Diode in IBIS?  If so, how?

Maggie Mahoney


 
From owner-ibis Thu Feb  8 10:50:41 2001
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Brian:

You are correct.

Bob Ross
Mentor Graphics


Baikuan Wang wrote:
> 
> Hi, IBIS exports,
> 
> Regarding V(t) curve, the following circuit is given including
> R_dut, L_dut and C_dut. My question is:
> The rising/falling waveform refers to Voltage at the node
> between C_dut and L_fixture. Am I right? Can you comment?
> Thanks.
> 
> Brian
> Sigity, Inc.
> 
> |
> |                      PACKAGE            |   TEST FIXTURE
> |       _________                         |
> |      |  DUT    |   L_dut   R_dut        | L_fixture  R_fixture
> |      |  die    |---@@@@@--/\/\/\--o-----|--@@@@---o---/\/\/\-----
> V_fixture
> |      |_________|                  |     |         |
> |                                   |     |         |
> |                                   |     |         |
> |                            C_dut ===    |        === C_fixture
> |                                   |     |         |
> |                                   |     |         |
> |                                  GND    |        GND
> |
 
From owner-ibis Thu Feb  8 10:59:55 2001
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From: "Peters, Stephen" <stephen.peters@intel.com>
To: "'Bob Ross'" <bob_ross@mentorg.com>, Baikuan Wang <wangbk@sigrity.com>
Cc: ibis@eda.org
Subject: RE: R_dut, L_dut and C_dut
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Hi Brian:

  I just wanted to point out that for best model creation, it is strongly
recomened that R_dut and L_dut be set to zero (i.e. take your data from Si
simulations with no package).
C_dut represents the output capactiance of the device and is pretty much
unavoidable.

  Regards,
  Stephen Peters
  Intel Corp.


-----Original Message-----
From: Bob Ross [mailto:bob_ross@mentorg.com]
Sent: Thursday, February 08, 2001 10:47 AM
To: Baikuan Wang
Cc: ibis@eda.org
Subject: Re: R_dut, L_dut and C_dut


Brian:

You are correct.

Bob Ross
Mentor Graphics


Baikuan Wang wrote:
> 
> Hi, IBIS exports,
> 
> Regarding V(t) curve, the following circuit is given including
> R_dut, L_dut and C_dut. My question is:
> The rising/falling waveform refers to Voltage at the node
> between C_dut and L_fixture. Am I right? Can you comment?
> Thanks.
> 
> Brian
> Sigity, Inc.
> 
> |
> |                      PACKAGE            |   TEST FIXTURE
> |       _________                         |
> |      |  DUT    |   L_dut   R_dut        | L_fixture  R_fixture
> |      |  die    |---@@@@@--/\/\/\--o-----|--@@@@---o---/\/\/\-----
> V_fixture
> |      |_________|                  |     |         |
> |                                   |     |         |
> |                                   |     |         |
> |                            C_dut ===    |        === C_fixture
> |                                   |     |         |
> |                                   |     |         |
> |                                  GND    |        GND
> |

 
From owner-ibis Thu Feb  8 18:11:37 2001
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                     IBIS Open Forum Meeting Agenda
                              for 2/16/01

                 Bridge Number    Reservation #   Passcode
                 (916) 356-9200   2-508083        4216977

All meetings are 8:00 AM to 9:55 AM Pacific Time.  When you call into the 
meeting, ask for the IBIS Open Forum hosted by Will Hobbs and give the
Reservation Number and Passcode.

8:00 Check-In, Intros, Announcements                         Ross

     - Intros of New IBIS Participants, Meeting Quorum       Ross
     - Membership Update and Treasurers Report               Ross/Fleming
     - Review of Previous Meeting's Minutes (and ARs)        Ross
     - Miscellany/Announcements                              All
     - Press & Web Page Updates                              Huq, All
     - New Models Available, Library Update                  Leventhal, All
     - Opens for New Issues                                  All

8:15 Administrative and Project Discussions

     International/External Progress
     - IEC 62014-1 (IBIS Version 3.2)                        Ross/Fleming
     - pr EIAJ ED-5302 Standard for I/O Interface Model      
          for Integrated Circuits (IMIC)                     Ross
     - IEC PWI 93-1 Models of Integrated Circuits for EMI 
       Behavioral Simulation (formerly designated as
       IEC 93/67/NP IBIS and EMC Simulation)                 Perrin/Ross
     - JEDEC JC-16 Modeling and Testing                      Sessions
    
     DesignCon 2001 IBIS Summit Meeting Review               Ross

     Date 2001 European IBIS Summit Meeting                  Ross

     IBIS Model Review Committee                             Angulo

     New Administrative Issues                               All

8:45 Technical Discussion (some topics may be deferred)

     Connector Proposal Review                               Panella

     IBIS Futures Group Report (IBIS-X, API, BIRDxx)         Peters

     BIRD65.2 - C_comp Refinements (Vote)                    Muranyi

     BIRD68.1 - Clarify that Rising and Falling Waveform     Lorang
              Tables Should be Correlated (Vote)

     BIRD69 - Golden Waveforms                               Edlund

     ibischk3 Bug Tracking                                   Ross

     - BUG53 BUG34 is not Implemented Correctly in         Ross/Mirmak
             Version 3.2.6

     - BUG49 Warning Message for Unreferenced Models,      Ross/Mirmak
             Submodels - resolution
   
     New Technical Issues                                    All

9:50 Wrap Up and Next Meetings Plans                         Ross

9:55 Sign Off
 
From owner-ibis Mon Feb 12 16:33:14 2001
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To: ibis@eda.org, ibis-users@eda.org, si-list@silab.eng.sun.com
Subject: EUROPEAN IBIS SUMMIT MEETING 2ND ANNOUNCEMENT
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To All:

This is the second announcement for the European IBIS Summit Meeting 
to be held on Friday, March 16, 2001 after the DATE 2001 exhibition
in Munich Germany.  The purpose is to promote communication among users
and developers of IBIS models in Europe.

The meeting is free and open to everyone.  Refreshments and a hot
lunch will be provided to all attendees.

Below is more information.  We have four presentations so far.

Bob Ross
Mentor Graphics


          E U R O P E A N   I B I S   S U M M I T   M E E T I N G
                   S E C O N D   A N N O U N C E M E N T 

Time/Date:     8:30 PM - 5:00 PM, Friday, March 16, 2001

Location:      ASTRON HOTEL/Neue Messe
               Eggenfeldener Strasse 100
               Munich, Germany 

               This hotel is near the DATE 2001 Conference

Content:       Presentations and Discussions

Purpose:       Solicit and Exchange IBIS Model Related Information and Ideas

Sponsors:      Cadence Design, Innoveda, Mentor Graphics, Zuken

DATE 2001:     March 13 - 16, 2001.  The IBIS meeting is scheduled
               the day after the DATE 2001 exhibition ends.

Location:      International Congress Center, Munich, Germany

               See http://www.date-conference.com for more information.

BACKGROUND

We have been holding interesting European IBIS Summit Meetings for the
last three years.  This year we are planning another meeting to include:

  Submitted Presentations on IBIS Topics (See below)
  Information about IBIS Version 3.2 and Activities
  Less formal Ad Hoc Presentations and Discussions
  IBIS Questions and Answers
  
Below is an invitation to register and also to submit presentations.

CALL FOR PARTICIPANTS

People involved in IBIS Model development, EDA tool development, and digital
circuit design are invited to participate in the European IBIS Summit meeting.
If you plan to participate, please register with the information below
(deadline, March 9, 2001):

  Name:
  E-mail address:
  Company:
  Telephone:

Send to:

  Karine Loudet (karine_loudet@mentor.com)  +33 1 40 94 74 54
  
CALL FOR PRESENTATIONS

We are seeking presentations from individuals who have IBIS experiences
or issues.  Some suggested subjects of interest are:

  IBIS Model Development Experiences
  Company IBIS Standards and Requirements
  Generating and Validating IBIS Models
  Future IBIS Requirements
  EMC/EMI IBIS Issues

Format of Presentation:  Overhead Projections
Time:                    15-30 Minutes
Electronic Archival:     We request electronic versions so that the
                         presentations can be archived and also made
                         available to non-attendees.  Formats used in
                         the past have been text, Power Point, Word, 
                         Postscript, and Acrobat.  Electronic presentations
                         should be made available by March 6, 2001.
                         Otherwise the presentor will be expected to provide
                         50 copies for distribution.

If you plan a presentation, please supply

  Title:
  Presenter:
  E-mail address:
  Company:
  Telephone:

  Estimate Time:

Send this to:

  Karine Loudet (karine_loudet@mentor.com)
  Bob Ross (bob_ross@mentor.com)

AGENDA

The agenda includes presentations, discussions.  A free lunch is scheduled
for all attendees.  Several presentations submitted so far are listed:

- Parasitic IC Emission Modeling
  Etienne Sicard, National Institute of Applied Science, Toulouse, France

- DOGEN, A Siemens Internal Model Tool, Extension 1999 - 2001
  Hans Pichlmaier, Siemens, Germany

- Title to be Determined
  Eckhard Lenski, Siemens, Germany

- LVDS Modeling
  Hazem Hegany and Mohammed Korany, Mentor Graphics, Egypt

  
FOR FURTHER INFORMATION:

Bob Ross,
Chair, EIA/IBIS Open Forum
Mentor Graphics
8005 S.W. Boeckman Road
Wilsonville, Oregon 97070
USA

(503) 685-0732
bob_ross@mentor.com
 
From owner-ibis Wed Feb 14 12:57:21 2001
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From: "Muranyi, Arpad" <arpad.muranyi@intel.com>
To: ibis@eda.org
Subject: RE: BIRD 65.2
Date: Wed, 14 Feb 2001 12:53:15 -0800
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Tom,

Al's response was correct that it is possible to have
capacitance when there is no IV curve.  For example,
in ASIC cell technology the designer may use a
complementary buffer in an open-source configuration,
which basically 3-states half of the buffer for ever.
In this case the IBIS model would not have an IV curve
for the always off transistor, even though it may have
capacitance.

However, your real question in my mind is whether we
should make all four C_comp values required.  I spelled
it out in the usage rules section that

|***              If the C_comp subparameter is not present at least
|***    one of the C_comp_pullup, C_comp_pulldown, C_comp_power, and
|***    C_comp_gnd subparameters is required.  

It says "at least one of the ... subparameters is required".

Does this answer your question?

Arpad
=======================================================


-----Original Message-----
From: Dagostino, Tom [mailto:tom_dagostino@mentorg.com]
Sent: Wednesday, February 07, 2001 11:50 PM
To: 'Al Davis'; ibis@eda.org
Subject: RE: BIRD 65.2


Re: required C_comp

In stead of requiring all 4 values of C_comp (you don't need C_comp_pullup,
etc with an open drain driver) require the appropriate C_comp for every IV
table in the model.

Tom Dagostino
IBIS and Tau Modeling Manager
SDD
Mentor Graphics Corp.
503-685-1613
tom_dagostino@mentor.com

 
From owner-ibis Wed Feb 14 16:57:52 2001
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Message-ID: <001301c096e9$d60e9480$6a1c690a@huawei.com>
From: "Rachel Huang" <rachel@huawei.com>
To: "Muranyi, Arpad" <arpad.muranyi@intel.com>, <ibis@eda.org>
References: <10C8636AE359D4119118009027AE998705155240@FMSMSX34>
Subject: Re: BIRD 65.2
Date: Thu, 15 Feb 2001 08:54:22 +0800
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Please stop sending me emails. You have sent them to a wrong person. Regards,

Rachel Huang
----- Original Message ----- 
From: Muranyi, Arpad <arpad.muranyi@intel.com>
To: <ibis@eda.org>
Sent: Thursday, February 15, 2001 4:53 AM
Subject: RE: BIRD 65.2


> Tom,
> 
> Al's response was correct that it is possible to have
> capacitance when there is no IV curve.  For example,
> in ASIC cell technology the designer may use a
> complementary buffer in an open-source configuration,
> which basically 3-states half of the buffer for ever.
> In this case the IBIS model would not have an IV curve
> for the always off transistor, even though it may have
> capacitance.
> 
> However, your real question in my mind is whether we
> should make all four C_comp values required.  I spelled
> it out in the usage rules section that
> 
> |***              If the C_comp subparameter is not present at least
> |***    one of the C_comp_pullup, C_comp_pulldown, C_comp_power, and
> |***    C_comp_gnd subparameters is required.  
> 
> It says "at least one of the ... subparameters is required".
> 
> Does this answer your question?
> 
> Arpad
> =======================================================
> 
> 
> -----Original Message-----
> From: Dagostino, Tom [mailto:tom_dagostino@mentorg.com]
> Sent: Wednesday, February 07, 2001 11:50 PM
> To: 'Al Davis'; ibis@eda.org
> Subject: RE: BIRD 65.2
> 
> 
> Re: required C_comp
> 
> In stead of requiring all 4 values of C_comp (you don't need C_comp_pullup,
> etc with an open drain driver) require the appropriate C_comp for every IV
> table in the model.
> 
> Tom Dagostino
> IBIS and Tau Modeling Manager
> SDD
> Mentor Graphics Corp.
> 503-685-1613
> tom_dagostino@mentor.com
> 
 
From owner-ibis Wed Feb 14 17:00:34 2001
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From: "Muranyi, Arpad" <arpad.muranyi@intel.com>
To: "'Al Davis'" <aldavis@ieee.org>, ibis@eda.org
Subject: RE: BIRD 65.2
Date: Wed, 14 Feb 2001 16:52:52 -0800
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Al,

You are raising good points.  First of all, I agree that IBIS-X
will solve most or all of these issues.  However, this BIRD was
originally written a long time ago, when we had no idea how long
it will take to make IBIS-X a reality.  Even though that day is
getting closer, I am still not entirely sure when it will happen.

When this BIRD was first written, the idea was to have a quick
release of IBIS4 with minor fixes.  This BIRD was written, because
when HSPICE implemented their new B-element (the IBIS element) they
connected the C_comp to the ideal "node 0" ground.  I could not
do ANY reasonable power bounce simulations that way, and I had
to ask them to fix it IMMEDIATELY, which they did.  So HSPICE
has this fixed now, and it would make sense for the IBIS spec
to have it fixed the same way.

Unfortunately, the quick release of IBIS4 has gotten dragged out
way beyond my expectations.  It was targeted to be done by the
summer following the East Coast summit a year and a half ago.
I agree, if IBIS-X happens soon it may not make sense to have
IBIS4 at all, but we don't know that for sure yet.

Now, I understand that this BIRD does not answer many of the
more detailed questions, such as voltage and frequency dependency,
non linearity, etc...  I will be glad to leave that to IBIS-X.
However, the intent was to get this fixed on the first order,
since the connection to node 0 does not make sense at all.

Regarding prototyping, is it not enough that HSPICE version 2000.2
has it and it works?

Regarding the splitting of the DC and AC currents, all I can say
is that whether it is done correctly or not, the HSPICE B-element
in v2000.2 is much more useful than the earlier versions without
this fix.  I CAN simulate return currents and power delivery
simulations much more accurately than I could before which was
basically bogus.  It may be true that there is still room for
improvements in terms of accuracy, but as I said it above, I
will leave those issues to be addressed in IBIS-X.

Regarding how you can measure the independent C_comp values I
am including an HSPICE example for you in the attachment.  I
am not sure if it will go through the email reflector, so I
am sending a duplicate of this message to you directly.  This
example shows only two capacitance calculations for C_vcc and
C_gnd, but the idea can be easily extended to four, if
independent clamping circuits would require that.  This
example is done in the time domain, and is not the only
way you can do this.  There are other techniques using
the .AC sweep for this.

Regarding TT (transit time), even though it can be viewed
as a related item (AC capacitance), I still think of it
differently.  It controls how the diode currents turn on
or off with respect to time.  This C_comp BIRD is more
related to how much of the total capacitance current should
come from the vcc and/or gnd pins.  This has not much to do
with time.

I hope this will answer some of your questions.

Sincerely,

Arpad
============================================================


-----Original Message-----
From: Al Davis [mailto:aldavis@ieee.org]
Sent: Wednesday, February 07, 2001 10:56 AM
To: ibis@eda.org
Subject: Re: BIRD 65.2


(Most of this message is a repeat, because the issues have not been 
addressed.)

I have some questions and reservations on this.  To summarize, although 
I agree that such a thing is needed, this proposal does not solve the 
problem adequately and has the potential for introducing problems that 
have not been considered.  Also, the problem it intends to solve 
becomes a non-issue once IBIS-X is completed.

The first question is how difficult it is to implement.  Ordinarily, I 
would say that it is necessary to prove it with a prototype, but it is 
a simple topology change, so it would be no worse than the existing 
C_comp.  Incidentally, the C_comp as we know it is rarely implemented 
correctly for driving models.  It is very difficult to do correctly.  
The implementations tend to be very good for non-driving models, where 
it is just a simple capacitor.  In any case, it is no worse than what 
we have so I am satisfied on this point.

Still, testing is a problem.  How do you measure it?  How do you 
validate that the measured data actually relates to reality?  Before 
approval of this bird, I would like to see a description of a procedure 
for measuring it, and a procedure for validating that the measured data 
is actually correct and useful.  These procedures should be tried on a 
prototype.

The purpose is stated to be information on how the capacitance is 
distributed over the 4 ground/power nodes.  Another way to look at it 
is how the current in the capacitance is distributed.  OK.  Now back 
up.  We have pullup/pulldown and the clamps for the DC conditions.  The 
proposed c_comp's are the dynamic parts.  Existing models usually do 
not model the split of these correctly.  The pullup and power clamp are 
sort of in parallel, so the measurement is usually to measure the 
clamps in input or tri-state mode, and the pullup/pulldown in driving 
mode, by measuring a total and subtracting off the clamps.  This often 
leads to the pullup/pulldown showing strange bahavior when it is masked 
by the clamps, because the subtraction magnifies the errors.  In any 
case, the current path is not necessarily as intended.  The standard 
provides the mechanism to properly model the current paths, but most 
models do not.  They arbitrarily mix them.

Given that most models do not get the DC split correct, what justifies 
even trying for the dynamic part?

The next issue is that this capacitance is strongly nonlinear.  
Measuring it in the various states produces very different results.  
Even then, there is no hint at what they do during the transition, 
other than that the wave tables include the effect.  The wave tables do 
not provide information on how that current is distributed to the 4
power/ground nodes, and possibly also to other connection nodes 
including input and enable.

The nonlinear nature of this capacitance is significant in the 
development of the simulator algorithms.  Some actual models will only 
work accurately when the capacitance is treated as nonlinear.

Part of this capacitance is already in the standard as transit time.  
The [TT*] parameters are essentially equivalent to the C_comp_power and 
C_comp_ground parts, complete with the nonlinear component.  Thus, part 
of what this bird proposes is already available.  (OK -- the bird asks 
for the linear part.)  Do you have any examples of actual models that 
use these parameters?  with test data showing the quality of 
correlation to the real device?  How many simulators support it fully?  
It has been in the standard for a long time.

Considering the number of unanswered questions, and that this 
functionality and much more will be available in IBIS-X, I think it is 
best not to rush into this.

So, Arpad, you should prototype this in IBIS-X (trivial) , and also 
prototype a measurement system for it in IBIS-X (not so trivial).  This 
will validate both this bird and IBIS-X.  The rest of us should wait 
for the answer.

Note to readers not familiar with IBIS-X:  This is a proposed future 
IBIS based on a macro language.  It is fully backward compatible with 
IBIS as we know it, and provides the capability to add extensions like 
this one easily.  Arpad and I are both on the sub-committee that is 
working on it.  A prototype implementation of IBIS-X is being built, 
and a partial one (incomplete work in progress) is available for review 
to the committee and to those interested.

The change in wording of the "required" section is an improvement, but 
it still needs work.

How about:

Either the C_comp parameter or all four of C_comp_pullup, 
C_comp_pulldown, C_comp_power, and C_comp_gnd are required.  If C_comp 
is provided, the others are not allowed.


------_=_NextPart_000_01C096E9.A059F410
Content-Type: application/octet-stream;
	name="c_meter.sp"
Content-Disposition: attachment;
	filename="c_meter.sp"

Capacitance meter circuit
***************************************************************************
.TRAN  100.0e-12  '2*dt'  SWEEP  CapV  LIN  'Points+1'  CapV1  CapV2
.OPTIONS POST=1 POST_VERSION=9007 ACCURATE NUMDGT=8
***************************************************************************
.PARAM  CapV1   =   0.0V
.PARAM  CapV2   =   5.0V
.PARAM  Points  =  20
.PARAM  dt      =   100.0e-9
***************************************************************************
.PARAM  dV      =   'CapV2-CapV1'
.PARAM  Ovh     =   0.1
.PARAM  CapV    =   0.0V
***************************************************************************
.MEAS  TRAN  dV_dt    DERIVATIVE V(Sweep)   WHEN  V(Sweep)=CapV
.MEAS  TRAN  Sw_I1    FIND  PAR('I(Vsw)')   WHEN  V(Sweep)=CapV  Rise=1
.MEAS  TRAN  Sw_I2    FIND  PAR('I(Vsw)')   WHEN  V(Sweep)=CapV  Fall=1
.MEAS  TRAN  Cap      PARAM='abs((Sw_I1-Sw_I2)/2/dV_dt)'

.MEAS  TRAN  Sw_Ivcc  FIND  PAR('I(Vvcc)')  WHEN  V(Sweep)=CapV  Fall=1
.MEAS  TRAN  Cap_vcc  PARAM='abs((Sw_Ivcc-I(Vvcc_iv))/dV_dt)'

.MEAS  TRAN  Sw_Ignd  FIND  PAR('I(Vgnd)')  WHEN  V(Sweep)=CapV  Fall=1
.MEAS  TRAN  Cap_gnd  PARAM='abs((Sw_Ignd-I(Vgnd_iv))/dV_dt)'

.MEAS  TRAN  Sum      PARAM='Cap_vcc+Cap_gnd'
***************************************************************************
Vvcc     Vcc       0  DC= 5.0
Vvcc_iv  Vcc_iv    0  DC= 5.0
*
Vgnd     GRND      0  DC= 0.0
Vgnd_iv  GRND_iv   0  DC= 0.0
*
Viv      Viv       0  DC= CapV
Vsw      Sweep     0  PWL
+  0ns        'CapV1-dV*Ovh'
+  dt         'CapV2+dV*Ovh'
+ '2*dt'      'CapV1-dV*Ovh'
***************************************************************************
X1 in Sweep Vcc       GRND        0 IO_buf
R1 in 0 1e+3
*
X2 in Viv   Vcc_iv       GRND_iv        0 IO_buf
R2 in 0 1e+3
*
*C1     Sweep   0    C=10.0pF               $ Test capacitor (constant)
*C1     Sweep   0    C='10.0e-12*V(sweep)'  $ Test capacitor (variable)
***************************************************************************
.END

------_=_NextPart_000_01C096E9.A059F410
Content-Type: application/octet-stream;
	name="IO_buf.inc"
Content-Transfer-Encoding: quoted-printable
Content-Disposition: attachment;
	filename="IO_buf.inc"

************************************************************************=
***
.SUBCKT IO_buf input output power ground enable
************************************************************************=
***
*X1  enable  en_b            power  ground  INVERTER
*X2  input   en_b    pre_p1  power  ground  NAND2
*X3  input   enable  pre_n1  power  ground  NOR2
*X4  pre_p1  pre_p2          power  ground  INVERTER  mult_p=3D2  =
mult_n=3D2
*X5  pre_n1  pre_n2          power  ground  INVERTER  mult_p=3D2  =
mult_n=3D2
*X6  pre_p2  pre_p2  gate_p  power  ground  NAND2     mult_p=3D4  =
mult_n=3D2
*X7  pre_n2  pre_n2  gate_n  power  ground  NOR2      mult_p=3D2  =
mult_n=3D4
*
*Mp  output gate_p power  power  PMOS  L=3D0.800U W=3D43.40U =
NRD=3D0.0897 NRS=3D0.0737
Mp  output power  power  power  PMOS  L=3D0.800U W=3D43.40U =
NRD=3D0.0897 NRS=3D0.0737
+                               AS=3D434.0P AD=3D217.0P PS=3D106.8U =
PD=3D53.40U
+                               M=3D12
*Mn  output gate_n ground ground NMOS  L=3D0.800U W=3D43.40U =
NRD=3D0.0897 NRS=3D0.0714
Mn  output power  ground ground NMOS  L=3D0.800U W=3D43.40U =
NRD=3D0.0897 NRS=3D0.0714
+                               AS=3D434.0P AD=3D217.0P PS=3D106.8U =
PD=3D53.40U
+                               M=3D6
*C1  pre_p2  ground  C=3D0.07pF
*C2  pre_n2  ground  C=3D0.07pF
*C3  gate_p  ground  C=3D0.04pF
*C4  gate_n  ground  C=3D0.03pF
*
R1  input   in_R    R=3D200
C5  in_R    ground  C=3D0.2pF
X8  input   out_r           power  ground  INVERTER
*
.SUBCKT INVERTER IN OUT POW GRND mult_p=3D1 mult_n=3D1 =
************************
Minv1   OUT  IN   POW   POW   PMOS  L=3D0.800U W=3D11.200U NRD=3D0.0714 =
NRS=3D0.0714
+                                   AS=3D26.88P AD=3D26.88P PS=3D27.20U =
PD=3D27.20U
+                                   M=3Dmult_p
Minv2   OUT  IN   GRND  GRND  NMOS  L=3D0.800U W=3D11.200U NRD=3D0.0714 =
NRS=3D0.0714
+                                   AS=3D26.88P AD=3D26.88P PS=3D27.20U =
PD=3D27.20U
+                                   M=3Dmult_n
.ENDS =
*********************************************************************
*
.SUBCKT NAND2 IN1 IN2 OUT POW GRND mult_p=3D1 mult_n=3D1 =
**********************
Mnand1  OUT  IN1  POW   POW   PMOS  L=3D0.800U W=3D11.200U NRD=3D0.0714 =
NRS=3D0.0714
+                                   AS=3D26.88P AD=3D13.44P PS=3D27.20U =
PD=3D13.60U
+                                   M=3Dmult_p
Mnand2  OUT  IN2  POW   POW   PMOS  L=3D0.800U W=3D11.200U NRD=3D0.0714 =
NRS=3D0.0714
+                                   AS=3D26.88P AD=3D13.44P PS=3D27.20U =
PD=3D13.60U
+                                   M=3Dmult_p
Mnand3  OUT  IN2  N_N   GRND  NMOS  L=3D0.800U W=3D11.200U NRD=3D0.0714 =
NRS=3D0.0714
+                                   AS=3D13.44P AD=3D26.88P PS=3D13.60U =
PD=3D27.20U
+                                   M=3Dmult_n
Mnand4  N_N  IN1  GRND  GRND  NMOS  L=3D0.800U W=3D11.200U NRD=3D0.0714 =
NRS=3D0.0714
+                                   AS=3D26.88P AD=3D13.44P PS=3D27.20U =
PD=3D13.60U
+                                   M=3Dmult_n
.ENDS =
*********************************************************************
*
.SUBCKT NOR2 IN1 IN2 OUT POW GRND mult_p=3D1 mult_n=3D1 =
***********************
Mnor1  P_P  IN1  POW   POW   PMOS  L=3D0.800U W=3D11.200U NRD=3D0.0714 =
NRS=3D0.0714
+                                  AS=3D26.88P AD=3D13.44P PS=3D27.20U =
PD=3D13.60U
+                                  M=3Dmult_p
Mnor2  OUT  IN2  P_P   POW   PMOS  L=3D0.800U W=3D11.200U NRD=3D0.0714 =
NRS=3D0.0714
+                                  AS=3D13.44P AD=3D26.88P PS=3D13.60U =
PD=3D27.20U
+                                  M=3Dmult_p
Mnor3  OUT  IN2  GRND  GRND  NMOS  L=3D0.800U W=3D11.200U NRD=3D0.0714 =
NRS=3D0.0714
+                                  AS=3D26.88P AD=3D13.44P PS=3D27.20U =
PD=3D13.60U
+                                  M=3Dmult_p
Mnor4  OUT  IN1  GRND  GRND  NMOS  L=3D0.800U W=3D11.200U NRD=3D0.0714 =
NRS=3D0.0714
+                                  AS=3D26.88P AD=3D13.44P PS=3D27.20U =
PD=3D13.60U
+                                  M=3Dmult_p
.ENDS =
*********************************************************************
*
************************************************************************=
***=20
* LEVEL3 MOS MODEL
*-----------------------------------------------------------------------=
---=20
.MODEL NMOS NMOS (LEVEL=3D3 UO=3D300.0 VTO=3D1.0
+         TPG=3D1 TOX=3D20E-9 NSUB=3D2.0E17 VMAX=3D200.0E3
+         RSH=3D70 XJ=3D100.0E-9 LD=3D100.0E-9 DELTA=3D20.00E-3 =
THETA=3D0.2
+         ETA=3D10.0E-3 KAPPA=3D20.0E-18 PB=3D0.80 JS=3D0.00
+         CGSO=3D2.0E-10 CGDO=3D2.0E-10 CJ=3D0.300E-3 CJSW=3D0.200E-9=20
+         MJ=3D300.0E-3 MJSW=3D200.0E-3)
*-----------------------------------------------------------------------=
---=20
.MODEL PMOS PMOS (LEVEL=3D3 UO=3D100.0 VTO=3D-1.0
+         TPG=3D-1 TOX=3D20E-9 NSUB=3D3.0E17 GAMMA=3D1.0 VMAX=3D250.0E3
+         RSH=3D80 XJ=3D400.0E-9 LD=3D100.0E-9 DELTA=3D20.0E-3 =
THETA=3D0.20
+         ETA=3D40.0E-3 KAPPA=3D20.0E-18 PB=3D0.80 JS=3D0.00
+         CGSO=3D5.0E-10 CGDO=3D4.0E-10 CJ=3D0.5E-3 CJSW=3D0.2E-9=20
+         MJ=3D500.0E-3 MJSW=3D300.0E-3)
*-----------------------------------------------------------------------=
---=20
.ENDS
************************************************************************=
***

------_=_NextPart_000_01C096E9.A059F410--
 
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From: Al Davis <aldavis@ieee.org>
To: "Muranyi, Arpad" <arpad.muranyi@intel.com>, ibis@eda.org
Subject: Re: BIRD 65.2
Date: Wed, 14 Feb 2001 18:24:08 -0800
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On Wed, 14 Feb 2001, Muranyi, Arpad wrote:
(answers to my questions.)

Thank you.  That is the information I was looking for.
 
From owner-ibis Tue Feb 20 13:37:00 2001
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Date: Tue, 20 Feb 2001 13:27:45 -0800
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Date: 2/20/01

SUBJECT: 2/16/01 EIA IBIS Open Forum Meeting Minutes

VOTING MEMBERS AND 2001 PARTICIPANTS LIST:
3Com (& CommWorks)             Roy Leventhal
Agilent                        (Mark Chang)
Ansoft Corporation             (Eric Bracken)
Applied Simulation Technology  Raj Raghuram, Norio Matsui, Fred Balistreri
Avanti                         (Chen Hongyu)
Brocade Communications         Robert Badal
Cadence Design                 Ian Dodd*
Cisco Systems                  Syed Huq, Lungfu Chen
Compaq                         Peter LaFlamme, Ron Bellomio, Quang Dam
Cypress                        (Rajesh Manapat)
EMC Corporation                Brian Arsenault, Jinhua Chen
Fairchild Semiconductor        Adam Tambone
IBM                            Michael Cohen*, Greg Edlund*, Wes Martin,
                               Yeon-Chang Hahm, Bill DeVey, Pravin Patel*
Innoveda (& HyperLynx)         Guy de Burgh*, John Angulo*
Intel Corporation              Stephen Peters, Arpad Muranyi*, Dave Lorang*,
                               Michael Mirmak*, Qinglun Chen, Will Hobbs
LSI Logic                      Larry Barnes*
Mentor Graphics                Bob Ross*, Tom Dagostino, Chris Reid,
                               Mike Donnelly, Hazem Hegazy, Tony Dunbar,
                               Griff Derryberry, Dan Lake, Sherif Hammad
                               Mohammed Korany, Weston Beal
Micron Technology              Randy Wolff*, Yong Phan*
Mitsubishi                     (Tam (Tom) Cao)
Molex Incorporated             Gus Panella, Brian O'Malley
Motorola                       (Ron Werner)
National Semiconductor         Milt Schwartz*
Nortel Networks                Calvin Trowell
North East Systems Associates  Edward Sayre
Philips Semiconductor          Zack Ciccone
Quantic EMC                    (Mike Ventham)
Robinson-Nugent, Inc.          (Alexander Barr)
Siemens AG                     Bernhard Unger, Helmut Katzier
SiQual                         Scott McMorrow, Rob Hinz, Bernard Voss,
                               Chris Brewster
Texas Instruments              Thomas Fisher, Stephen Nolan, Ramzi Ammar
Time Domain Analysis Systems   Dima Smolyansky, Steve Corey
Tyco Electronics               (Russell Moser)
Via Technologies               (Weber Chuang)
Zuken (& Incases)              (Werner Rissiek)

OTHER PARTICIPANTS IN 2001:
Actel Corporation              Silvia Montoya
Acuson                         Kim Helliwell
AMCC                           Jeff Smith
Apple Computer                 John Figueroa
ASIS Ltd                       David Wright
EIA                            Cecilia Fleming*
FCI                            Sercu Stefaan
Foundary Networks              Bertram Chan
Framatom Conectors             Danny Morlion
Fujitsu Ltd                    Tadashi Arai, Takeshi Murakami
Huawei Technologies            Rachild Chen
Hyundai Electronics            Jongho Kang
Intrinsix Corporation          Steven Chin
Nokia                          Tapani von Ravner
Oak Technology                 Darmin Jin
Plexus Technology Group        Joseph Socha
Signal Integrity Software      Douglas Burns, Barry Katz, Walter Katz
STMicroelectronics             Peter Hirt
Xilinx                         Susan Wu
Independent, Consultant        Al Davis

In the list above, attendees at the meeting are indicated by *. Principal
members or other active members who have not attended are in parentheses.
Participants who no longer are in the organization are in square brackets.

Upcoming Meetings:  The bridge numbers for future IBIS teleconferences are as
follows:

  Date                Bridge Number    Reservation #    Passcode
  March 2, 2001       (916) 356-9200   2-508084         6782941
  March 16, 2001      European IBIS Summit Meeting - No Phone Bridge

All meetings are 8:00 AM to 9:55 AM Pacific Time.  We try to have agendas out
7 days before each Open Forum and meeting minutes out within 7 days after.
When you call into the meeting, ask for the IBIS Open Forum hosted by Will
Hobbs and give the reservation number and passcode.

NOTE: "AR" = Action Required.

-------------------------------- MINUTES -------------------------------------
INTRODUCTIONS AND MEETING QUORUM
Pravin Patel from IBM introduced himself.  He is replacing Michael Cohen who
will be in a new position that is less directly involved with IBIS.  Pravin's
main interest is in working with and using IBIS models.

MEMBERSHIP UPDATE AND TREASURER'S REPORT
Cecilia Fleming reported that she has about 22 payments so far, with more
expected based on the latest accounting report.  Bob commented that we may
lose one member due to economic problems, but we have invoiced three other
potential members for a total of 36 invoices.

Bob reviewed the year 2000 financial results.  We have income of about
$32,100 versus the budget of $22,800.  Our expenses were $18,700 and
the revised budget of $21,400.  The net income was $18,700 versus the
revised budget of $1,400. About $6,200 of income came from non-budgeted
ibischk3 parser license payments for 2000.  Cecilia is working on the final
numbers to account for some additional membership payments made in 2000.
The profits will be handled as a reserve account to be used for future
expenses.

REVIEW OF MINUTES AND AR'S
The January 5, 2001 IBIS Minutes were approved without change.

The January 29, 2001 IBIS Minutes were approved with this correction:

Dr. Norio Matusi submitted a correction for the January 29, 2001 IBIS Summit
Minutes regarding the writeup of his presentation - LSI POWER AND GROUND MODEL
FOR EMI SIMULATION by Norio Matsui, Applied Simulation Technology and Hiroshi
Wabuka, NEC.

Norio adds clarification to the last sentence: "Also die interconnect details
were not simulated in this study"   He submitted the paragraph below:

  "We have modeled interconnect details in our study.  You may
  find this in two slides.  One is flow chart of modeling.  Net list
  plus CR model means that we have extracted so many inter-
  connection CR models.  You may find the result in a slide
  which shows simplified model.  A couple of capacitances both
  for power and ground are seen simplified model.  The original
  interconnection CRs are involved in the net list."

The January 29, 2001 IBIS Minutes were approved with the above correction
(added to the uploaded minutes).

The AR's will be discussed during the meeting.

MISCELLANY/ANNOUNCEMENTS
None.

PRESS AND WEB PAGE UPDATES
Cecilia Fleming reported that the Upcoming Events have been updated per an
input from Syed Huq.  Bob Ross reported that Syed Huq made some Roster updates
and added the Linux executable for ibischk3.

NEW MODELS AVAILABLE, LIBRARY UPDATE
Bob Ross reported some Network Switching and Routing IBIS models from Music
Semiconductor:

  http://www.music-ic.com/technical/techfiles.html

and some communication IBIS models from Cirrus Logic:

  http://www.cirrus.com/design/products/pubs/index.cfm?TypeID=14

Also Bob reported that several links list a number of Lattice Semiconductor
IBIS models.  Registration is required to get the models.  The links are:

  http://www.latticesemi.com/lit/html/ibis/mach4a.html
  http://www.latticesemi.com/lit/html/ibis/isp2000ve.html
  http://www.latticesemi.com/lit/html/ibis/isp5000v.html
  http://www.latticesemi.com/lit/html/ibis/ispgdx.html

Also, a link to a Real Time Video of Arpad Muranyi's IBIS Modeling Training
course delivered April 18, 2000 exists at:

  http://www.silicontech.com/home/seminar-index.shtml

Arpad Muranyi commented that this link had been up for quite a while.

OPENS FOR NEW ISSUES
None.

INTERNATIONAL/EXTERNAL PROGRESS
- IEC 62014-1 (IBIS Version 3.2) - Cecilia Fleming stated that she requested
status information from IEC TC 93 Secretariat, Greg Ledenbach.  After the
meeting, she sent Bob the following response from Greg:

  "The document is published for FDIS voting. The record date was
  17-January-2001. The voting period is 26-January-2001 to 13-April-2001 with
  parallel voting in CENELEC."

- pr EIAJ ED-5302 Standard for I/O Interface Model for Integrated Circuits
(IMIC) - No report.

- IEC PWI 93-1 Models of Integrated Circuits for EMI Behavioral Simulation
(formerly designated as IEC 93/67/NP IBIS and EMC Simulation) - Bob Ross
expects at least one presentation and maybe more at the European IBIS Summit
Meeting in Munich, Germany on March 16, 2001.

- JEDEC JC-16 - Modeling and Testing - Bob Ross had no report from the JEDEC
JC-16 and JC-42 meetings in December 2000.  Bob received the minutes sent by
Cecilia Fleming.  There was not any significant IBIS content at that meeting.

- T10, Project 1414-DT - SCSI Signal Modeling (a Technical Committee of the
National Committee for Information Technology (NCITS)) - Larry Barnes reported
that T10 is holding a meeting in California from February 20 - 22, 2001.
Information about the Committee can be found on the web site:

  http://www.t10.org/

Larry stated that the Committee is interested in producing an IBIS BIRD to
reduce drive strength upon detection of a second data bit and subsequent
bits.

Bob Ross will put the T10 Committee on the agenda for a regular report.

DESIGNCON 2001 IBIS SUMMIT MEETING REVIEW
Bob Ross asked for comments on the DesignCon 2001 IBIS meeting.  Bob noted
that we had an excellent turnout of 72 plus probably several more who did
not sign in.  There were some minor logistics issues that were resolved
based on the event organizer wanting to save some money.  The issues included
having refreshments in the room and scheduling the large room at the last
minute.  These issues were successfully resolved.

John Angulo commented that the IBIS-X material was well-received.

Guy de Burgh reported that the IBIS booth setup and takedown went smoothly.
About half of the EIA brochures were taken, indicating interest in our
activities.  He is keeping the remainder for another Summit meeting.  Bob
stated the the logo display looked good.  This was a passive booth that served
as a meeting place for contacting people.

DATE 2001 EUROPEAN IBIS SUMMIT MEETING
Bob Ross gave a report on the European IBIS Summit meeting to be held Friday,
March 16, 2000 in Munich, Germany along with the Design Automation and Testing
in Europe (DATE 2001) conference and exhibit.  The IBIS Summit Meeting is on
the day after the tradeshow portion of the show.  Bob stated that four
companies are co-sponsors of the meeting: Cadence, Innoveda, Mentor Graphics,
and Zuken (Incases).  This pays for the meeting room, refreshments and free
lunch to participants.

Two announcements have been sent out, one at the end of January 2001, and the
other on February 12, 2001.

Four presentations are planned so far:

  Parasitic IC Emisson Modeling
  Etienne Sicard, National Institute of Applied Science, Toulouse, France

  DOGEN, A Siemens Internal Model Tool, Extension 1999 - 2001
  Hans Pichlmaier, Siemens, Germany

  Experiences with and Tips for IBIS Models
  Eckhard Lenski, Siemens, Germany

  LVDS Modeling
  Hazem Hegazy and Mohammed Korany, Mentor Graphics, Egypt

Arpad Muranyi may give an update on IBIS-X, if he attends:

   IBIS-X
   Arpad Muranyi, Intel, USA

Bob stated that the meeting will probably last most of the day.

IBIS MODEL REVIEW COMMITTEE DISCUSSION
John Angulo stated that he sent out two LVDS IBIS models from Texas
Instruments for review.

Also John is working with the semiconductor vendor concerning another model
for review.

CONNECTOR PROPOSAL REVIEW
Bob Ross noted that a meeting was held on January 16, 2001, mostly to prepare
for the IBIS Summit Meeting and also to discuss the revised Version 0.960
document.  The next meeting is scheduled on February 27, 2001 to resolve
some final details.

Bob stated that the main issues remaining are finalizing the header section
in a manner consistent with the IBIS-X work, and finalizing the expansion
code provided by Ian Dodd.

Arpad Muranyi questioned when this would be completed.  He wants to use the
Specification for package modeling and stated that we need to have a target
date for release.  Ian clarified that the first version will not have
frequency dependent losses.

After some discussion, Bob set the goal of completion of the document by the
Design Automation Conference time frame in June 2001.  The Committee needs to
review the work, and the actual public review standardization process takes
at least three months.

Version 0.960 has most of the technical content.  It does need some editorial
cleanup.  The next meeting will be devoted to the final details for release.

IBIS FUTURES (IBIS-X, API, BIRDxx)
Bob Ross stated that Working Group meetings were held on January 9, 2001,
January 23, 2001, and February 6, 2001.  The next meeting is scheduled on
February 20, 2001.

John Angulo felt that people were interested in the IBIS-X work at the
January 26, 2001 IBIS Summit.  There was interest in differential buffers,
current mode logic and equation based modeling.

John stated that Stephen Nolan was interested in a proof of concept exercise
to validate its functionality.  The goal of the Working Group is to have a
document of the 0.9 level to be released in the June time frame for the IBIS
Summit Meeting held at the Design Automation Conference.

BIRD65.2 - C_comp REFINEMENTS
Bob Ross introduced BIRD65.2 by stating that C_comp is split into four values
to be attached to up to four rails.  We have already had discussion on it at
the January 5, 2001 meeting and almost conducted a vote.  Arpad Muranyi, the
author, provided some additional clarification in issuing BIRD65.2.  There
was more IBIS reflector discussion and apparently satisfactory responses.

Arpad commented that splitting C_comp into four components was needed for a
better calculation of ground and power bounce effects for simultaneous
switching output analysis.  In response to e-mail comments by Al Davis, Arpad
stated that BIRD65.2 has been prototyped in a commercial product.  Arpad did
provide in his e-mail utilities to measure and extract the C_comp components.
Finally he reworded a paragraph to clarify that if any of the components of
C_comp_* were defined, C_comp was not to be used.  The EDA tool would issue a
Warning if the C_comp components did not add up to the optional C_comp value.

Bob noted that another issue was also clarified.  C_comp components could be
defined even if the corresponding I-V tables were not defined.  For example,
a C_comp_pullup could be defined for Open_drain models that did not have
the corresponding [Pullup] table.

Bob called for a vote.  BIRD65.2 was approved by unanimous vote.

BIRD68.1 - CLARIFY THAT RISING AND FALLING WAVEFORM TABLES SHOULD BE
CORRELATED
Bob Ross introduced BIRD68.1 that Dave Lorang issued.  BIRD68.1 had revisions
discussed at the January 5, 2001 meeting and clarified that the input stimulus
could define the common reference point for both [Rising Waveform] and
[Falling Waveform] tables.  Bob elaborated that while BIRD68.1 was designed to
provide a more accurate analysis of intersymbol interference, the correlation
was already necessary in modeling differential buffers and handling [Driver
Schedule] and [Submodel] constructs.

It was noted that BIRD68.1 did not add any new functionality.  It clarified
the intent of the existing functionality.  With this clarification, equal
lead-in delay times could be removed from both [Rising Waveform] and [Falling
Waveform] tables for faster clock rate analysis.

Bob called for a vote.  BIRD68.1 was approved by Unanimous vote.

Bob stated that approved BIRD65.2 and BIRD68.1 would be added to the draft
Version 4.0 specification containing four other approved BIRDs that resides
in the work in progress directory:

  http://www.eda.org/pub/ibis/wip/

BIRD69 - GOLDEN WAVEFORMS
Greg Edlund provided a brief introduction to BIRD69.  Greg indicated that he
had trouble getting his purchasing department to make validated IBIS models a
requirement for purchasing components.  Embedding the validation waveforms and
test circuit provides a solution where the golden waveform keywords could be
required by certain vendors.  It was noted that the golden waveforms, [Rising
Golden Waveform] and [Falling Golden Waveform] are different than the
waveforms used in producing the model.

Bob Ross commented on some IBIS reflector comments on BIRD69.  One dealt with
aligning the syntax of the test circuit more closely with some other keywords
that indicate connection to ground or power rails.  Another stated that the
Drive_model_name sub-parameter was redundant since the golden waveforms were
already in the specified driver model.

Bob also added that the equal sign "=" is used in IBIS only for numerical
assignment, and a space is used for name or argument assignment.  Greg
accepted these comments and would respond in a BIRD69.1 with changes.

Bob then opened the discussion to EDA vendors and semiconductor vendors to
ask whether they would implement the test circuit analysis or provide the
golden waveform data if BIRD69 were passed.  The general EDA vendor response
was that they would probably do other higher priority projects first unless
pressured by users or competition.  The semiconductor vendors have a difficult
enough time to provide the regular IBIS data and would not want to add to the
golden waveform data.  Then Bob asked the user community whether they would
insist on validation data per BIRD69. Greg responded that there might be
interest in doing this.  Making this a condition of purchase would force the
EDA vendors or some other vendors to add the validation and correlation
software in their products.

Bob expressed some concerns over BIRD69.  While on one hand it provides data
that is useful, but could be ignored by tools, it does add complication to the
IBIS document.  It also does not provide support for the growing need for
differential buffer validation.  (This could be handled with a separate BIRD.)
However, it may still be worthwhile to work on BIRD69 and make the suggested
changes.

IBISCHK3 BUG TRACKING
- BUG53 - BUG34 is Incorrectly Fixed in Version 3.2.6
  Bob Ross commented that Michael Mirmak issued BUG53 in response to an
  incorrect fix in BUG34.  Certain missing I-V warning messages are issued for
  cases where the I-V tables can be missing.  Since Warnings are given for
  correct models, Bob classified BUG53 as Severe, High, and Open.  BUG53 needs
  to fixed soon.

  Bob also commented that he reviewed ibischk3.2.6 and it appears to have
  correct fixes for the other BUGs.

- BUG49 - Warning Message for Unreferenced Models, Submodels
  Bob Ross noted that BUG49 was discussed at the January 5, 2001 meeting, but
  we ran out of time before reaching final resolution.  Michael Mirmak also
  submitted BUG49.  It called for a one time Warning message for unreferenced
  [Model]s that should have been referenced in [Pin], [Model Selector],
  [Driver Schedule], or [Series Pin Mapping].  It also provided for Warning
  messages for each unreferenced [Submodel].

  After some discussion the resolution was to add BUG49 to the list of BUGs
  to be fixed.  Currently BUGs 48-53 are on the list.  Bob noted that BUG53
  is the highest priority (to provide the correct fix of BUG34).  Currently
  users may use ibischk3 Version 3.2.6, but also may need to use ibischk3
  Version 3.2.5 to test provide assurance that the BUG53 Warning message is
  not a problem.

CONCLUDING TOPICS
In the remaining time, Bob Ross and others continued the discussion regarding
the goals of IBIS.  One issue is whether to include equation based modeling
in the first release of IBIS-X, or to conduct a staged release with it coming
in the second release .  Package modeling is not yet being addressed.  The
nodal syntax can be used, but the full package modeling should support
coupled transmission line package models.

Michael Cohen thanked everyone and stated that it was an honor to work with
the IBIS Committee.  Bob thanked Michael for his service during the past
years.

NEXT MEETING:
The next teleconference meeting will be on Friday, March 2, 2001, from
8:00 AM to 10:00 AM.

==============================================================================
                                      NOTES

IBIS CHAIR: Bob Ross (503) 685-0732, Fax (503) 685-4897
            bob_ross@mentor.com
            Modeling Engineer, Mentor Graphics
            8005 S.W. Boeckman Road, Wilsonville, OR 97070

VICE CHAIR: Stephen Peters (503) 264-4108, Fax: (503) 264-4515
            stephen.peters@intel.com
            Senior Hardware Engineer, Intel Corporation
            M/S JF1-209
            2111 NE 25th Ave.
            Hillsboro, OR 97124-5961

SECRETARY:  Guy de Burgh (805) 988-8250, Fax: (805) 988-8259
            gdeburgh@innoveda.com
            Senior Manager, Innoveda
            1369 Del Norte Rd.
            Camarillo, CA 93010-8437

LIBRARIAN:  Roy Leventhal (837) 797-2152, Fax: (847) 222-2799
            roy_leventhal@3com.com
            Senior Engineer, CommWorks Corp. (a wholly owned 3Com subsidiary)
            1800 W. Central Rd.
            Mt. Prospect, IL 60056-2293

WEBMASTER:  Syed Huq (408) 525-3399, Fax: (408) 526-5504
            shuq@cisco.com
            Manager, Hardware Engineering, Cisco Systems
            170 West Tasman Drive
            San Jose, CA 95134-1706

POSTMASTER: John Angulo (425) 869-2320, Fax: (425) 881-1008
            jangulo@innoveda.com
            Development Engineer, Innoveda
            14715 N.E. 95th Street, Suite 200
            Redmond, WA 98052

This meeting was conducted in accordance with the EIA Legal Guides and EIA
Manual of Organization and Procedure.

The following e-mail addresses are used:

  ibis-request@eda.org
      To join, change, or drop from either the IBIS Open Forum Reflector
      (ibis@eda.org), the IBIS Users' Group Reflector (ibis-users@eda.org)
      or both.  State your request.

  ibis-info@eda.org
      To obtain general information about IBIS, to ask specific questions
      for individual response, and to inquire about joining the EIA-IBIS
      Open Forum as a full Member.

  ibis@eda.org
      To send a message to the general IBIS Open Forum Reflector.  This
      is used mostly for IBIS Standardization business and future IBIS
      technical enhancements.  Job posting information is not permitted.

  ibis-users@eda.org
      To send a message to the IBIS Users' Group Reflector.  This is
      used mostly for IBIS clarification, current modeling issues, and
      general user concerns.  Job posting information is not permitted.

  ibischk-bug@eda.org
      To report ibischk2/3 parser bugs.  The Bug Report Form Resides on
      eda.org in /pub/ibis/bugs/ibischk/bugform.txt along with reported bugs.

      To report s2ibis, s2ibis2 and s2iplt bugs, use the Bug Report Forms
      which reside under eda.org in /pub/ibis/bugs/s2ibis/bugs2i.txt,
      /pub/ibis/bugs/s2ibis2/bugs2i2.txt, & /pub/ibis/bugs/s2iplt/bugsplt.txt
      respectively.

Information on IBIS technical contents, IBIS participants, and actual
IBIS models are available on the IBIS Home page found by selecting the
Electronic Information Group under:

  http://www.eigroup.org/ibis/ibis.htm

Check the pub/ibis directory on eda.org for more information on previous
discussions and results.  You can get on via FTP anonymous.
==============================================================================


--------------21F0843F613CA4958129AD78--


 
From owner-ibis Wed Feb 23 06:49:58 2000
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To All:

BIRD69.1 is issued with changes provided by Greg Edlund and documented in the
ANALYSIS PATH/DATA THAT LED TO SPECIFICATION section.

Bob Ross
Mentor Graphics


*******************************************************************************
*******************************************************************************

BIRD ID#:      69.1
ISSUE TITLE:   Golden Waveforms
REQUESTOR:     Greg Edlund, IBM
DATE SUBMITTED:    December 15, 2000, February 22, 2001
DATE ACCEPTED BY IBIS OPEN FORUM:     Pending

*******************************************************************************
*******************************************************************************

STATEMENT OF THE ISSUE:

Golden Waveforms are a set of SPICE waveforms simulated using known ideal
test loads.  They are useful in verifying the accuracy of behavioral
simulation results for any given simulator.  They are not the same thing as
the traditional VT tables recommended in the "IBIS Cookbook."  The "I/O Buffer
Accuracy Handbook" recommends a set of ideal test loads for classical
push-pull and open-drain drivers.

There is currently a problem with including Golden Waveforms in an IBIS
datasheet: the simulator tries to use these waveforms to construct its
stimulus waveform, and erroneous simulations result.

This BIRD proposes a new syntactical construct to tell the simulator
that a waveform is a Golden Waveform.  The simulator may then choose to
ignore the data or (better yet) run a set of simulations using the network
and circuit parameters provided and report the correlation between the
simulation results and the Golden Waveforms.

*******************************************************************************

STATEMENT OF THE RESOLVED SPECIFICATIONS:

I propose that we add two new keywords and a corresponding set of sub-
parameters to accommodate the inclusion of Golden Waveform in an IBIS
datasheet.  These sub-parameters should also facilitate simulation.

|=============================================================================
|    Keywords:  [Rising Golden Waveform], [Falling Golden Waveform]
|    Required:  No
| Description:  Documents expected behavioral simulation results using
|               known ideal test loads for simulation accuracy reporting.
|  Sub-Params:  C1_near, Rs_near, Ls_near, C2_near, Rp1_near, Rp2_near,
|               Td, Zo, Rp1_far, Rp2_far, C2_far, Ls_far, Rs_far, C1_far,
|               R_diff, T_ref, V_term1, V_term1_min, V_term1_max, V_term2,
|               V_term2_min, V_term2_max,
|               Pkg_pin, Receiver_model_name, Test_point
| Usage Rules:  Each [Rising Golden Waveform] and [Falling Golden Waveform]
|               keyword introduces a table of voltage vs. time points that
|               describe the shape of a reference waveform.  These voltage-
|               time waveforms are generated under the conditions specified
|               by the subparameters.  The process, temperature, and voltage
|               conditions under which the waveforms are generated must be
|               identical to those used to generate the VI and VT tables.
|               The Golden Waveforms must be generated using unpackaged
|               driver and receiver models.
|
|               The table itself consists of one column of time points, then
|               three columns of points in the standard typ, min, and max
|               format.  The four entries must be placed on a single line and
|               must be separated by at least one white space.  All four
|               columns are required.  However, data is only required in the
|               typical column.  If minimum or maximum data is not available,
|               use the reserved word "NA".  The first value in the time
|               column need not be '0'.  The waveform table can contain a
|               maximum of 1000 data rows.  A maximum of 100 waveform tables
|               are allowed per model.
|
|               The subparameters specify the loading conditions under which
|               the waveform is generated.  The diagram below shows the
|               interconnection of these elements.
|
|                                    V_term1
|                                 o-----------o
|                                 |           |
|                                 \           \            receiver_model_name
|   ______                        /           /                        ______
|  |      |  NEAR        Rp1_near \           \ Rp1_far          FAR  |      |
|  | |\   |                       /           /                       | |\   |
|  | | \  |   Rs_near  Ls_near    |   _____   |     Ls_far  Rs_far    | | \  |
|  | |  >-|---o--/\/\--@@@@--o----o--O_____)--o----o--@@@@--/\/\--o---|-|  > |
|  | | /  |   |              |    |   Td      |    |              |   | | /  |
|  | |/   |   | C1_near      |    \   Zo      \    | C2_far       |   | |/   |
|  |______|  ===            ===   /           /   ===            ===  |______|
|             |      C2_near |    \           \    |       C1_far |
|             |              |    /           /    |              |
|             |              |    |  V_term2  |    |              |
|             o--------------o    o-----------o    o--------------o
|             |                Rp2_near    Rp2_far                |
|            GND                                                 GND
|
|
|               R_diff is not shown in the schematic but would be connected
|               between the true and complement far end nodes in the case
|               of a differential driver.  In this case, the true and
|               complement nets will be identical as defined by the other
|               subparameters.
|
|               T_ref is the time at which the output of the driver crosses
|               V_meas when driving C_ref/R_ref/V_ref with an input signal
|               identical to the one used to generate the Golden Waveform.
|               Behavioral simulators may use T_ref to establish a time
|               base for time correlation measurements.
|
|               V_term1 defines the termination voltage for parallel
|               termination resistors Rp1_near and Rp1_far.  This voltage
|               is not related to the [voltage range] keyword.
|               V_term2 defines the termination voltage for parallel
|               termination resistors Rp2_near and Rp2_far.
|
|               Pkg_pin is required and indicates which, if any, pin model
|               was used to generate the Golden Waveform.  If the Golden
|               Waveform represents a packaged simulation, then its value
|               must be a valid pin name as defined by the [Pin] keyword.
|               If the Golden Waveform represents an unpackaged simulation,
|               then the Pkg_pin subparameter must have the value "none."
|
|               Receiver_model_name is required and indicates which, if any,
|               receiver model was used to simulate the Golden Waveform.
|               If the Golden Waveform represents a simulation using a
|               receiver, its value must be a valid model name.  If the 
|               Golden Waveform represents a simulation with no receiver,
|               then the Receiver_model_name subparameter must have the
|               value "none."
|
|               Test_point is required and defines the node in the above
|               schematic at which the Golden Waveform is measured.  It must
|               have the value near or far.
|
|               Using the Golden Waveform tables, it is possible to run
|               behavioral simulations under conditions identical to the ones
|               used to generate the waveforms in SPICE.  The behavioral
|               waveforms can be correlated against the Golden Waveforms in
|               voltage and time to produce a quantitative measurement of
|               the accuracy of 1) the model data, 2) the behavioral model,
|               and 3) the behavioral simulator.
|
|               If a parameter is not used, it defaults to the value
|               specified in the following table:
|
|               C1_near     = 1f 
|               Rs_near     = 1M
|               Ls_near     = 1p 
|               C2_near     = 1f 
|               Rp1_near    = 1M
|               Rp2_near    = 1M
|               Td          = 1ns
|               Zo          = 50
|               Rp1_far     = 1M
|               Rp2_far     = 1M
|               C2_far      = 1f
|               Ls_far      = 1p
|               Rs_far      = 1M
|               C1_far      = 1f
|               T_ref       = 1.00ns
|               R_diff      = 1M
|               V_term1     = 1.0
|               V_term1_min = 1.0
|               V_term1_max = 1.0
|               V_term2     = 1.0
|               V_term2_min = 1.0
|               V_term2_max = 1.0
|
|-----------------------------------------------------------------------------
[Rising Golden Waveform]
C1_near     = 1p 
Rs_near     = 10
Ls_near     = 1n 
C2_near     = 1p 
Rp1_near    = 100
Rp2_near    = 100
Td          = 1ns
Zo          = 50
Rp1_far     = 100
Rp2_far     = 100
C2_far      = 1p
Ls_far      = 1n
Rs_far      = 10
C1_far      = 1p
R_diff      = 100
T_ref       = 2.00ns
V_term1     = 1.50
V_term1_min = 1.35
V_term1_max = 1.65
V_term2     = 0.00
V_term2_min = 0.05
V_term2_max = 0.05
Pkg_pin none
Receiver_model_name Input1
Test_point far
|
| Time            V(typ)              V(min)              V(max)
   0.0000s       25.2100mV           15.2200mV           43.5700mV
   0.2000ns       2.3325mV           -8.5090mV           23.4150mV
   0.4000ns       0.1484V            15.9375mV            0.3944V
   0.6000ns       0.7799V             0.2673V             1.3400V
   0.8000ns       1.2960V             0.6042V             1.9490V
   1.0000ns       1.6603V             0.9256V             2.4233V
   1.2000ns       1.9460V             1.2050V             2.8130V
   1.4000ns       2.1285V             1.3725V             3.0095V
   1.6000ns       2.3415V             1.5560V             3.1265V
   1.8000ns       2.5135V             1.7015V             3.1600V
   2.0000ns       2.6460V             1.8085V             3.1695V
| ...
  10.0000ns       2.7780V             2.3600V             3.1670V
|
[Falling Golden Waveform]
C1_near     = 1p 
Rs_near     = 10
Ls_near     = 1n 
C2_near     = 1p 
Rp1_near    = 100
Rp2_near    = 100
Td          = 1ns
Zo          = 50
Rp1_far     = 100
Rp2_far     = 100
C2_far      = 1p
Ls_far      = 1n
Rs_far      = 10
C1_far      = 1p
R_diff      = 100
T_ref       = 2.00ns
V_term1     = 1.50
V_term1_min = 1.35
V_term1_max = 1.65
V_term2     = 0.00
V_term2_min = 0.05
V_term2_max = 0.05
Pkg_pin none
Receiver_model_name Input1
Test_point far
| Time            V(typ)              V(min)              V(max)
   0.0000s        5.0000V             4.5000V             5.5000V
   0.2000ns       4.7470V             4.4695V             4.8815V
   0.4000ns       3.9030V             4.0955V             3.5355V
   0.6000ns       2.7313V             3.4533V             1.7770V
   0.8000ns       1.8150V             2.8570V             0.8629V
   1.0000ns       1.1697V             2.3270V             0.5364V
   1.2000ns       0.7539V             1.8470V             0.4524V
   1.4000ns       0.5905V             1.5430V             0.4368V
   1.6000ns       0.4923V             1.2290V             0.4266V
   1.8000ns       0.4639V             0.9906V             0.4207V
   2.0000ns       0.4489V             0.8349V             0.4169V
| ...
  10.0000ns       0.3950V             0.4935V             0.3841V
|
*******************************************************************************

ANALYSIS PATH/DATA THAT LED TO SPECIFICATION:

The East Coast IBIS Users Group identified a need to document accuracy
information and formed the IBIS Accuracy Subcommittee to address this need.
This subcommittee met during the year 1997-1998 and drafted what became
the "I/O Buffer Accuracy Handbook."  This document outlines a set of
procedures that can be used by modeling engineers to verify behavioral
simulation accuracy, using SPICE simulations as a reference.  This BIRD
provides an infrastructure within IBIS for communicating important accuracy
data as defined by the "I/O Buffer Accuracy Handbook."

It is not intended that this BIRD require any simulator changes except to
ignore the new keywords and sub-parameters.  However, should a simulator
vendor decide to use the new keywords and sub-parameters, it is intended
that they provide a complete set of information for carrying out simulations
that may be used to report correlation statistics to the user.  In the
absence of simulator support, the user would have to perform the correlation
work manually (which many of us are doing already) using the information
in the new Golden Waveform tables.

It is entirely up to the modeling engineer to decide which values to assign
to which sub-parameters.  This is an engineering decision that should be
based on the design of the I/O buffer under test.  The generalized test load
network should cover a broad range of I/O buffer families.

Since these new keywords and sub-parameters are not required, I don't see
any backward compatibility problems.

BIRD69.1 Changes by Greg Edlund:

I have updated BIRD 69 according to our discussion during the Open Forum
last Friday.  Here is a summary of the changes:

1. Removed subparameter Driver_model_name (was redundant).

2. Removed "=" from Node and Receiver_model_name.

3. Changed name of subparameter Node to Test_point to enhance clarity.

4. Added subparameter R_diff to handle far-end termination for differential
drivers.

5. Replaced V_term with V_term1.  Added V_term2 to allow for termination to
negative voltages, e.g. ECL.

6. Added subparameter Pkg_pin to indicate which package model, if any, to
use.


*******************************************************************************

ANY OTHER BACKGROUND INFORMATION:

I have discussed similar ideas with members of several simulator vendor
companies, and each had a positive response in general.

Please see the "I/O Buffer Accuracy Handbook" for complete details on
correlation test loads, procedures, and metrics.

The C program "ack" could provide an example of correlation metric
calculation for interested simulator vendors.

Thanks to Jerry Hayes at IBM for coming up with the idea for a generalized
test load network.


*******************************************************************************
 
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                     IBIS Open Forum Meeting Agenda
                              for 3/2/01

                 Bridge Number    Reservation #   Passcode
                 (916) 356-9200   2-508084        6782941

All meetings are 8:00 AM to 9:55 AM Pacific Time.  When you call into the 
meeting, ask for the IBIS Open Forum hosted by Will Hobbs and give the
Reservation Number and Passcode.

8:00 Check-In, Intros, Announcements                         Ross

     - Intros of New IBIS Participants, Meeting Quorum       Ross
     - Membership Update and Treasurers Report               Ross/Fleming
     - Review of Previous Meeting's Minutes (and ARs)        Ross
     - Miscellany/Announcements                              All
     - Press & Web Page Updates                              Huq, All
     - New Models Available, Library Update                  Leventhal, All
     - Opens for New Issues                                  All

8:15 Administrative and Project Discussions

     International/External Progress
     - IEC 62014-1 (IBIS Version 3.2)                        Ross/Fleming
     - pr EIAJ ED-5302 Standard for I/O Interface Model      
          for Integrated Circuits (IMIC)                     Ross
     - IEC PWI 93-1 Models of Integrated Circuits for EMI 
       Behavioral Simulation (formerly designated as
       IEC 93/67/NP IBIS and EMC Simulation)                 Perrin/Ross
     - JEDEC JC-16 Modeling and Testing                      Sessions
     - T10, Project 1414-DT - SCSI Signal Modeling           Barnes

     Date 2001 European IBIS Summit Meeting                  Ross

     IBIS Model Review Committee                             Angulo

     New Administrative Issues                               All

8:45 Technical Discussion (some topics may be deferred)

     Connector Proposal Review                               Panella

     IBIS Futures Group Report (IBIS-X, API, BIRDxx)         Peters

     BIRD69.1 - Golden Waveforms                             Edlund

     ibischk3 Bug Tracking                                   Ross

     - BUG54 - Corners with NA Give Bad Test Load Warnings   Mirmak

     New Technical Issues                                    All

9:50 Wrap Up and Next Meetings Plans                         Ross

9:55 Sign Off
 
From owner-ibis Tue Feb 27 01:10:47 2001
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Subject: EUROPEAN IBIS SUMMIT 3/16/01 - THIRD ANNOUNCEMENT
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To All:

This is the third announcement for the European IBIS Summit Meeting 
to be held on Friday, March 16, 2001 after the DATE 2001 exhibition
in Munich Germany.  The purpose is to promote communication among users
and developers of IBIS models in Europe.

The meeting is free and open to everyone.  Refreshments and a hot
lunch will be provided to all attendees.

Below is more information.  We have approximately 11 presentations
so far listed below.  Some titles are tentative.

If you have not done so, please respond to Karine Loudet if you
are attending.

Bob Ross
Mentor Graphics


          E U R O P E A N   I B I S   S U M M I T   M E E T I N G
                    T H I R D   A N N O U N C E M E N T 

Time/Date:     8:30 PM - 5:00 PM, Friday, March 16, 2001

Location:      ASTRON HOTEL/Neue Messe
               Eggenfeldener Strasse 100
               Munich, Germany 

               This hotel is near the DATE 2001 Conference

Content:       Presentations and Discussions

Purpose:       Solicit and Exchange IBIS Model Related Information and Ideas

Sponsors:      Cadence Design, Innoveda, Mentor Graphics, Zuken

DATE 2001:     March 13 - 16, 2001.  The IBIS meeting is scheduled
               the day after the DATE 2001 exhibition ends.

Location:      International Congress Center, Munich, Germany

               See http://www.date-conference.com for more information.

BACKGROUND

We have been holding interesting European IBIS Summit Meetings for the
last three years.  This year we are planning another meeting to include:

  Submitted Presentations on IBIS Topics (See below)
  Information about IBIS Version 3.2 and Activities
  Less formal Ad Hoc Presentations and Discussions
  IBIS Questions and Answers
  
Below is an invitation to register and also to submit presentations.

CALL FOR PARTICIPANTS

People involved in IBIS Model development, EDA tool development, and digital
circuit design are invited to participate in the European IBIS Summit meeting.
If you plan to participate, please register with the information below
(deadline, March 9, 2001):

  Name:
  E-mail address:
  Company:
  Telephone:

Send to:

  Karine Loudet (karine_loudet@mentor.com)  +33 1 40 94 74 54
  
CALL FOR PRESENTATIONS

We are seeking presentations from individuals who have IBIS experiences
or issues.  Some suggested subjects of interest are:

  IBIS Model Development Experiences
  Company IBIS Standards and Requirements
  Generating and Validating IBIS Models
  Future IBIS Requirements
  EMC/EMI IBIS Issues

Format of Presentation:  Overhead Projections
Time:                    15-30 Minutes
Electronic Archival:     We request electronic versions so that the
                         presentations can be archived and also made
                         available to non-attendees.  Formats used in
                         the past have been text, Power Point, Word, 
                         Postscript, and Acrobat.  Electronic presentations
                         should be made available by March 6, 2001.
                         Otherwise the presentor will be expected to provide
                         50 copies for distribution.

If you plan a presentation, please supply

  Title:
  Presenter:
  E-mail address:
  Company:
  Telephone:

  Estimate Time:

Send this to:

  Karine Loudet (karine_loudet@mentor.com)
  Bob Ross (bob_ross@mentor.com)

AGENDA

The agenda includes presentations, discussions.  A free lunch is scheduled
for all attendees.  Some titles have not been finalized:

- EMC Standardization Progress (title to be determined)
  Jean-Claude Perrin, Texas Instruments, France

- EMC Models (title to be determined)
  Christian Marot, Siemens, France

- Parasitic IC Emisson Modeling
  Etienne Sicard, National Institute of Applied Science, Toulouse, France

- Ground-Noise Model
  Mariusz Faferko, Fraunhofer Institute Reliability and Microintegration,
  Germany

- Radiated Emission Model for IC
  Peter Kralicek, Fraunhofer Institute Reliability and Microintegration,
  Germany

- DOGEN, A Siemens Internal Model Tool, Extension 1999 - 2001
  Hans Pichlmaier, Siemens AG, Germany

- Experiences with and Tips for IBIS Models
  Eckhard Lenski, Siemens AG, Germany

- IBIS Bus Modeling (title to be determined)
  Bernhard Unger, Siemens AG, Germany

- LVDS Modeling
  Hazem Hegany and Mohammed Korany, Mentor Graphics, Egypt

- (title to be determined)
  John Barrie, Zuken, England

- IBIS-X
  Arpad Muranyi, Intel, USA
  
FOR FURTHER INFORMATION:

Bob Ross,
Chair, EIA/IBIS Open Forum
Mentor Graphics
8005 S.W. Boeckman Road
Wilsonville, Oregon 97070
USA

(503) 685-0732
bob_ross@mentor.com
 
From owner-ibis Tue Feb 27 15:33:18 2001
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-Girish.


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From owner-ibis Tue Feb 27 15:40:30 2001
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Subject: PCI/PCIX STANDARD IBIS MODEL...
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Hi All,
Does anyone have a standard PCI and PCIX IBIS Model?
I have a standard PCIX Model but the test load seems to be too heavy for the
Weak Buffer(Tval(max)Rising/Falling Edge Test Load).I made my PCIX Model
from the PCIX Bus Specifications,Rev 1.0. 
Thanks in advance for the help.

-Girish


Simulation Engineer
Signal Integrity Group
Dell Computer Corporation.
(512)-723-6210
E-Mail:Girish_Singh@Dell.com
www.dell.com
	 


 

