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Sessions and papers
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Presenter / moderator
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Files
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Keynote 1
Communications 101 for EDA
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Steve Schultz (SI2)
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Presentation
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Impact of design-manufacturing interface
(I)
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Juan-Antonio Carballo (IBM)
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The X Architecture: Roadmap for Design for
Manufacturing Methodology
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Ken Rygler (Rygler and Associates)
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Presentation
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Manufacturability Metrics and RET Tradeoffs
for Physical Design and Layout
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Luigi Capodieci (AMD)
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Paper
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Design Rules for Real Patterns
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Alexander Starikov (Intel)
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Paper
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Impact of design-manufacturing interface
(II)
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Juan-Antonio Carballo (IBM)
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Layout Methodology Impact of Resolution Enhancement
Techniques
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Lars Liebmann (IBM)
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Paper
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Designing-in test & repair IP for manufacturing
yield
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Yervant Zorian (Virage Logic)
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Presentation
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Impact of DFM and RET on Standard-Cell Design
Methodology
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Paul de Dood (Prolific)
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Paper
Presentation
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The importance of layout density control
in semiconductor manufacturing
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Vivek Singh (Intel)
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Paper
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Unified databases and data models
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Gary Smith (Gartner)
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Design Systems Evolution and the Need for
a Standard Data Model
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John Darringer (IBM)
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Paper
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Facilitating EDA Flow Interoperability with
the OpenAccess Design Database
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Mark Bales (Cadence)
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Paper
Presentation
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Introduction to Milkyway
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Lawrence Brevard (Synopsys)
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Presentation
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Interoperability, Data Models, and Databases
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Michael Riepe (Magma)
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Presentation
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New automated methodologies and flows (I)
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Naresh Sehgal (Intel)
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Hard IP Group Design
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Howard Sachs (Telairity)
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Paper
Presentation
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The Arrow of Time: Following Timing Constraints in an RTL to
GDSII Flow
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Dwight Hill (Synopsys)
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Paper
Presentation
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eL-Architect: Using a Design Flow e-Learning
tool in CAD/EDA and VLSI education
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José A. Lima (Univ. of Minho)
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Presentation
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New automated methodologies and flows (II)
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Takahide Inoue (STARC)
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Software-Compiled System Design: A Methodology
for Field-Programmable Design
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Jeff Jussel (Celoxica)
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Paper
Presentation
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Improving SoC Design Flows with Robust and
Precise Embedded Memory Models
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Jay Abraham (Silicon Metrics)
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Paper
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Building Design Process in a Startup Company
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David Gates (ATI)
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Paper
Presentation
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Keynote 2
Design Challenges & Solutions for 90nm/130nm
Technology
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David Lan (TSMC)
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Methodologies of Industrial Usage of Formal
Verification
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Sandeep Shukla (Virginia Tech)
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Property Specification: The key to an Assertion-Based
Verification Platform
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Harry Foster (Verplex Systems)
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Paper
Presentation
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A Verification Synergy: Constraint-Based
Verification
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Carl Pixley (Synopsys)
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Paper
Presentation
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Formal Interface Compliance Verification
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C. Norris Ip (Tempus Fugit)
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Paper
Presentation
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Content in EDP package but not presented
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PROGRESS: Combining Topdown and Bottom-up
System Design Methodology
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James Armstrong et al. (Virginia Tech.)
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Paper
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Total Hot Spot Management from Design Rule
Definition to Silicon Fabrication
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Soichi Inoue (Toshiba)
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Paper
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Code Generation from a Single Source Structural
Specification
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C. Schneider (Micronas)
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Paper
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